Inventor · disambiguated record
Katsuhiro Kitahashi
Also filed as: KITAHASHI KATSUHIRO
3 granted patents·1 pending application·35 citations·filing 2001–2010
70Inventor score
Top patents by PatentIndex Score
4 records- 0181US8824773B2Defect observation method and defect observation deviceMINEKAWA YOHEI·Filed 2010·Granted Sep 2, 2014·6 cites·20 claims
- 0273US6968079B2Investigation device and investigation methodHITACHI LTD·Filed 2001·Granted Nov 22, 2005·20 cites·10 claims
- 0369US7181060B2Defect inspection methodHITACHI LTD·Filed 2002·Granted Feb 20, 2007·9 cites·13 claims
- 0438US2012327212A1Sem type defect observation device and defect image acquiring methodKITAHASHI KATSUHIRO·Filed 2010·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →