Inventor · disambiguated record
Masayuki Hashitani
Also filed as: HASHITANI MASAYUKI
12 granted patents·1 pending application·20 citations·filing 2008–2016
85Inventor score
Top patents by PatentIndex Score
13 records- 0179US8053820B2Semiconductor device and method of manufacturing the sameSEIKO INSTR INC·Filed 2009·Granted Nov 8, 2011·6 cites·20 claims
- 0278US8236648B2Trench MOS transistor and method of manufacturing the sameHASHITANI MASAYUKI·Filed 2008·Granted Aug 7, 2012·8 cites·7 claims
- 0366US9552009B2Reference voltage generator having diode-connected depletion MOS transistors with same temperature coefficientSEIKO INSTR INC·Filed 2014·Granted Jan 24, 2017·2 cites·7 claims
- 0465US9213415B2Reference voltage generatorSEIKO INSTR INC·Filed 2013·Granted Dec 15, 2015·2 cites·3 claims
- 0558US9804628B2Reference voltage generatorSEIKO INSTR INC·Filed 2014·Granted Oct 31, 2017·1 cites·1 claims
- 0654US8716142B2Semiconductor device and method of manufacturing the sameHASHITANI MASAYUKI·Filed 2008·Granted May 6, 2014·1 cites·6 claims
- 0751US2014084378A1Semiconductor integrated circuit deviceSEIKO INSTR INC·Filed 2013·Application pending·0 cites
- 0849US10014294B2Semiconductor integrated circuit device having enhancement type NMOS and depression type MOS with N-type channel impurity region and P-type impurity layer under N-type channel impurity regionSII SEMICONDUCTOR CORP·Filed 2016·Granted Jul 3, 2018·0 cites·2 claims
- 0949US9276065B2Semiconductor device and method of manufacturing the sameSEIKO INSTR INC·Filed 2014·Granted Mar 1, 2016·0 cites·2 claims
- 1046US8598026B2Semiconductor device and method of manufacturing the sameHASHITANI MASAYUKI·Filed 2011·Granted Dec 3, 2013·0 cites·20 claims
- 1138US9524961B2Semiconductor deviceSII SEMICONDUCTOR CORP·Filed 2016·Granted Dec 20, 2016·0 cites·9 claims
- 1238US8847308B2Semiconductor device having a trench structureSEIKO INSTR INC·Filed 2012·Granted Sep 30, 2014·0 cites·1 claims
- 1336US8643093B2Semiconductor device and method of manufacturing the sameHASHITANI MASAYUKI·Filed 2011·Granted Feb 4, 2014·0 cites·4 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →