Inventor · disambiguated record
Liyang Lai
Also filed as: LAI LIYANG
7 granted patents·75 citations·filing 2007–2014
83Inventor score
Technology areasG01R
Top patents by PatentIndex Score
7 records- 0194US7840865B2Built-in self-test of integrated circuits using selectable weighting of test patternsMENTOR GRAPHICS CORP·Filed 2007·Granted Nov 23, 2010·35 cites·23 claims
- 0293US9689918B1Test access architecture for stacked memory and logic diesMENTOR GRAPHICS CORP·Filed 2013·Granted Jun 27, 2017·15 cites·18 claims
- 0391US9222978B2Two-dimensional scan architectureHUANG YU·Filed 2012·Granted Dec 29, 2015·11 cites·13 claims
- 0480US9086459B2Detection and diagnosis of scan cell internal defectsGUO RUIFENG·Filed 2009·Granted Jul 21, 2015·10 cites·14 claims
- 0576US9015543B2Diagnosis-aware scan chain stitchingMENTOR GRAPHICS CORP·Filed 2012·Granted Apr 21, 2015·3 cites·20 claims
- 0663US9335376B2Test architecture for characterizing interconnects in stacked designsMENTOR GRAPHICS CORP·Filed 2014·Granted May 10, 2016·1 cites·10 claims
- 0745US8862956B2Compound hold-time fault diagnosisHUANG YU·Filed 2012·Granted Oct 14, 2014·0 cites·18 claims
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