Inventor · disambiguated record
Koji Maruno
Also filed as: MARUNO KOJI
4 granted patents·10 citations·filing 2004–2016
62Inventor score
Top patents by PatentIndex Score
4 records- 0156US7158906B2Test method, test system, and program thereforNEC ELECTRONICS CORP·Filed 2004·Granted Jan 2, 2007·10 cites·3 claims
- 0245US9496201B2Semiconductor device and method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2016·Granted Nov 15, 2016·0 cites·3 claims
- 0342US9379040B2Semiconductor device and method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2015·Granted Jun 28, 2016·0 cites·3 claims
- 0441US9147673B2Semiconductor power converter and method of manufacturing the sameTOSHIBA KK·Filed 2013·Granted Sep 29, 2015·0 cites·8 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →