Inventor · disambiguated record
Anthonius Ruiter
Also filed as: RUITER ANTHONIUS · RUITER ANTHONIUS G
8 granted patents·1 pending application·26 citations·filing 2011–2025
84Inventor score
Top patents by PatentIndex Score
9 records- 0196US11635449B2Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)BRUKER NANO INC·Filed 2022·Granted Apr 25, 2023·6 cites·20 claims
- 0295US11307220B2Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)BRUKER NANO INC·Filed 2021·Granted Apr 19, 2022·6 cites·22 claims
- 0395US11029330B2Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)BRUKER NANO INC·Filed 2019·Granted Jun 8, 2021·8 cites·20 claims
- 0493US11940461B2Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)BRUKER NANO INC·Filed 2023·Granted Mar 26, 2024·2 cites·20 claims
- 0582US12241911B2Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)BRUKER NANO INC·Filed 2024·Granted Mar 4, 2025·0 cites·20 claims
- 0674US2025147066A1Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (AFM-nDMA)BRUKER NANO INC·Filed 2025·Application pending·0 cites
- 0773US9116168B2Low drift scanning probe microscopeBRUKER NANO INC·Filed 2014·Granted Aug 25, 2015·2 cites·11 claims
- 0865US8869310B2Low drift scanning probe microscopeRUITER ANTHONIUS·Filed 2011·Granted Oct 21, 2014·2 cites·15 claims
- 0958US10900997B2Low drift system for a metrology instrumentBRUKER NANO INC·Filed 2019·Granted Jan 26, 2021·0 cites·20 claims
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