Inventor · disambiguated record
Hyowon Park
Also filed as: PARK HYOWON
2 granted patents·4 pending applications·0 citations·filing 2022–2025
25Inventor score
Files withKLA CORP6
Top patents by PatentIndex Score
6 records- 0174US12480893B2Optical and X-ray metrology methods for patterned semiconductor structures with randomnessKLA CORP·Filed 2024·Granted Nov 25, 2025·0 cites·39 claims
- 0268US2025237619A1Optical and x-ray metrology methods for patterned semiconductor structures with randomnessKLA CORP·Filed 2025·Application pending·0 cites
- 0353US12019030B2Methods and systems for targeted monitoring of semiconductor measurement qualityKLA CORP·Filed 2022·Granted Jun 25, 2024·0 cites·19 claims
- 0451US2024085321A1Methods And Systems For Model-less, Scatterometry Based Measurements Of Semiconductor StructuresKLA CORP·Filed 2023·Application pending·0 cites
- 0548US2024302301A1X-Ray Scatterometry Based Measurements Of Memory Array Structures Stacked With Complex Logic StructuresKLA CORP·Filed 2024·Application pending·0 cites
- 0645US2023169255A1Methods And Systems For Data Driven Parameterization And Measurement Of Semiconductor StructuresKLA CORP·Filed 2022·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →