Inventor · disambiguated record
John D. Spalding
Also filed as: SPALDING JOHN D
11 granted patents·376 citations·filing 2007–2010
93Inventor score
Top patents by PatentIndex Score
11 records- 0195US7738121B2Method and inspection head apparatus for optically measuring geometric dimensions of a partGII ACQUISITION LLC·Filed 2007·Granted Jun 15, 2010·55 cites·26 claims
- 0294US7755754B2Calibration device for use in an optical part measuring systemGII ACQUISITION LLC·Filed 2007·Granted Jul 13, 2010·35 cites·31 claims
- 0393US7738088B2Optical method and system for generating calibration data for use in calibrating a part inspection systemGII ACQUISITION LLC·Filed 2007·Granted Jun 15, 2010·32 cites·24 claims
- 0492US8237935B2Method and system for automatically inspecting parts and for automatically generating calibration data for use in inspecting partsNYGAARD MICHAEL G·Filed 2010·Granted Aug 7, 2012·23 cites·29 claims
- 0592US7777900B2Method and system for optically inspecting partsGII ACQUISITION LLC·Filed 2007·Granted Aug 17, 2010·35 cites·28 claims
- 0692US7633046B2Method for estimating thread parameters of a partGII ACQUISITION LLC·Filed 2007·Granted Dec 15, 2009·29 cites·37 claims
- 0792US7633634B2Optical modules and method of precisely assembling sameGII ACQUISITION LLC·Filed 2007·Granted Dec 15, 2009·33 cites·21 claims
- 0892US7403872B1Method and system for inspecting manufactured parts and sorting the inspected partsGII ACQUISITION LLC·Filed 2007·Granted Jul 22, 2008·75 cites·19 claims
- 0991US7796278B2Method for precisely measuring position of a part to be inspected at a part inspection stationGII ACQUISITION LLC·Filed 2008·Granted Sep 14, 2010·40 cites·22 claims
- 1090US7907267B2Optical method and system for generating calibration data for use in calibrating a part inspection systemGII ACQUISITION LLC·Filed 2010·Granted Mar 15, 2011·13 cites·23 claims
- 1183US8013990B2Calibration device for use in an optical part measuring systemGII ACQUISITION LLC·Filed 2010·Granted Sep 6, 2011·6 cites·20 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →