Inventor · disambiguated record
Won Joo Yun
Also filed as: YUN WON JOO
61 granted patents·6 pending applications·345 citations·filing 2007–2025
98Inventor score
Files withHYNIX SEMICONDUCTOR INC30MICRON TECHNOLOGY INC14SAMSUNG ELECTRONICS CO LTD11YUN WON JOO8LEE HYUN WOO2
Top patents by PatentIndex Score
67 records- 0198US7598783B2DLL circuit and method of controlling the sameHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Oct 6, 2009·51 cites·64 claims
- 0294US7633324B2Data output strobe signal generating circuit and semiconductor memory apparatus having the sameHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Dec 15, 2009·27 cites·29 claims
- 0393US7821310B2DLL circuit having duty cycle correction and method of controlling the sameHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Oct 26, 2010·25 cites·30 claims
- 0491US7800422B2Semiconductor memory apparatusHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Sep 21, 2010·21 cites·6 claims
- 0591US7560963B2Delay-locked loop apparatus and delay-locked methodHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Jul 14, 2009·21 cites·37 claims
- 0689US12505875B2Data input buffer with a branched DFE reset pathMICRON TECHNOLOGY INC·Filed 2023·Granted Dec 23, 2025·1 cites·20 claims
- 0789US7868673B2Power-down mode control apparatus and DLL circuit having the sameHYNIX SEMICONDUCTOR INC·Filed 2010·Granted Jan 11, 2011·11 cites·11 claims
- 0888US8237478B2DLL circuit having activation pointsYUN WON JOO·Filed 2011·Granted Aug 7, 2012·8 cites·5 claims
- 0988US7830186B2Delay locked loop apparatusHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Nov 9, 2010·15 cites·7 claims
- 1087US9654093B2Electronic device having a delay locked loop, and memory device having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted May 16, 2017·8 cites·18 claims
- 1186US9870808B2Memory device for performing calibration operationSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Jan 16, 2018·8 cites·20 claims
- 1286US9501041B2Duty cycle error detection device and duty cycle correction device having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Nov 22, 2016·6 cites·9 claims
- 1386US7605623B2Semiconductor memory apparatus with a delay locked loop circuitHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Oct 20, 2009·17 cites·27 claims
- 1483US10078110B2Short circuit detecting device of stacked memory chips and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Sep 18, 2018·3 cites·20 claims
- 1582US7535270B2Semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted May 19, 2009·13 cites·12 claims
- 1678US12499079B2Apparatus including reconfigurable interface and methods of manufacturing the sameMICRON TECHNOLOGY INC·Filed 2024·Granted Dec 16, 2025·0 cites·19 claims
- 1778US9959935B2Input-output circuit for supporting multiple-input shift register (MISR) function and memory device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted May 1, 2018·5 cites·15 claims
- 1877US7782105B2Semiconductor memory device for generating a delay locked clock in early stageHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Aug 24, 2010·8 cites·6 claims
- 1977US7755405B2DLL circuit and method of controlling the sameHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Jul 13, 2010·10 cites·28 claims
- 2076US7791384B2Phase synchronization apparatusHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Sep 7, 2010·7 cites·13 claims
- 2176US7683684B2Power-down mode control apparatus and DLL circuit having the sameHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Mar 23, 2010·8 cites·12 claims
- 2275US7928783B2Semiconductor integrated circuitHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Apr 19, 2011·7 cites·17 claims
- 2375US7761757B2Apparatus and method of setting test mode in semiconductor integrated circuitHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Jul 20, 2010·4 cites·15 claims
- 2473US7557627B2Semiconductor memory device for generating a delay locked clock in early stageHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Jul 7, 2009·7 cites·8 claims
- 2571US7719333B2Power control circuit, method of controlling power control circuit, and DLL circuit including power control circuitHYNIX SEMICONDUCTOR INC·Filed 2007·Granted May 18, 2010·5 cites·11 claims
- 2671US7576581B2Circuit and method for correcting duty cycleHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Aug 18, 2009·5 cites·25 claims
- 2770US9214202B2Input buffer and memory device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Dec 15, 2015·3 cites·20 claims
- 2869US8742806B2Power control circuit, method of controlling power control circuit, and DLL circuit including power control circuitYUN WON JOO·Filed 2012·Granted Jun 3, 2014·2 cites·8 claims
- 2968US7782106B2Circuit and method for correcting duty cycleHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Aug 24, 2010·4 cites·14 claims
- 3067US11886376B2Apparatus including reconfigurable interface and methods of manufacturing the sameMICRON TECHNOLOGY INC·Filed 2021·Granted Jan 30, 2024·0 cites·21 claims
- 3167US2025379550A1Decision feedback equalizer with variable gain amplifierMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 3266US8085073B2Phase synchronization apparatusLEE HYUN WOO·Filed 2010·Granted Dec 27, 2011·2 cites·6 claims
- 3366US7764096B2DLL circuit and method of controlling the sameHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Jul 27, 2010·5 cites·21 claims
- 3465US7750703B2Duty cycle correcting circuitHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Jul 6, 2010·5 cites·20 claims
- 3564US8120397B2Delay locked loop apparatusYUN WON JOO·Filed 2010·Granted Feb 21, 2012·2 cites·18 claims
- 3663US11922996B2Apparatuses, systems, and methods for ZQ calibrationMICRON TECHNOLOGY INC·Filed 2021·Granted Mar 5, 2024·0 cites·20 claims
- 3763US8228104B2Duty cycle correcting circuit and method of correcting a duty cycleYUN WON-JOO·Filed 2008·Granted Jul 24, 2012·5 cites·14 claims
- 3860US11996162B2Synchronous input buffer enable for DFE operationMICRON TECHNOLOGY INC·Filed 2022·Granted May 28, 2024·0 cites·20 claims
- 3960US8390364B2Internal voltage generation circuit for semiconductor apparatusKIM KI HAN·Filed 2010·Granted Mar 5, 2013·2 cites·10 claims
- 4059US12423253B2Current-controlled buffer using analog biasMICRON TECHNOLOGY INC·Filed 2023·Granted Sep 23, 2025·0 cites·20 claims
- 4159US10908212B2Semiconductor memory device including a shift registerSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Feb 2, 2021·0 cites·19 claims
- 4258US11855812B2Hybrid loop unrolled decision feedback equalizer architectureMICRON TECHNOLOGY INC·Filed 2022·Granted Dec 26, 2023·0 cites·24 claims
- 4358US10651156B2Memory package and memory device utilizing an intermediate chipSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted May 12, 2020·1 cites·20 claims
- 4458US8154326B2Power control circuit, method of controlling power control circuit, and DLL circuit including power control circuitYUN WON JOO·Filed 2010·Granted Apr 10, 2012·1 cites·6 claims
- 4558US7994831B2Semiconductor integrated circuit and method of controlling the sameHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Aug 9, 2011·3 cites·14 claims
- 4657US11619964B2Methods for improving timing in memory devices, and related devices and systemsMICRON TECHNOLOGY INC·Filed 2021·Granted Apr 4, 2023·0 cites·17 claims
- 4754US10509070B2Short circuit detecting device of stacked memory chips and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Dec 17, 2019·0 cites·15 claims
- 4853US11789835B2Test input/output speed conversion and related apparatuses and methodsMICRON TECHNOLOGY INC·Filed 2020·Granted Oct 17, 2023·0 cites·21 claims
- 4953US8085072B2Semiconductor integrated circuit having delay locked loop circuitLEE HYUN WOO·Filed 2009·Granted Dec 27, 2011·2 cites·18 claims
- 5053US7952403B2Update control apparatus in DLL circuitHYNIX SEMICONDUCTOR INC·Filed 2009·Granted May 31, 2011·2 cites·11 claims
Showing the top 50 of 67 patent records by PatentIndex Score.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →