Inventor · disambiguated record
Haruhiko Hatano
Also filed as: HATANO HARUHIKO
5 granted patents·2 citations·filing 2010–2016
63Inventor score
Technology areasH01J
Top patents by PatentIndex Score
5 records- 0153US9159530B2Electron microscope sample holder and sample observation methodHOSOYA KOTARO·Filed 2011·Granted Oct 13, 2015·1 cites·10 claims
- 0250US8921784B2Scanning electron microscopeIWAYA TORU·Filed 2010·Granted Dec 30, 2014·1 cites·6 claims
- 0348US10269533B2Anti-contamination trap, and vacuum application deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Apr 23, 2019·0 cites·23 claims
- 0437US8766184B2Scanning electron microscopeHATANO HARUHIKO·Filed 2011·Granted Jul 1, 2014·0 cites·10 claims
- 0533US10784074B2Charged particle beam apparatus and control method thereofHITACHI HIGH TECH CORP·Filed 2016·Granted Sep 22, 2020·0 cites·13 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →