Inventor · disambiguated record
Craig M. Herzinger
Also filed as: HERZINGER CRAIG M
88 granted patents·2 pending applications·1,926 citations·filing 1995–2022
99Inventor score
Files withJ A WOOLLAM CO INC69HERZINGER CRAIG M9J A WOOLLAM CO2HALE JEFFREY S1HASSLER CHRISTOPHER D1
Top patents by PatentIndex Score
90 records- 0198US7633625B1Spectroscopic ellipsometer and polarimeter systemsJ A WOOLLAM CO INC·Filed 2007·Granted Dec 15, 2009·115 cites·2 claims
- 0297US7907280B2Method of constructing a deviation angle self compensating substantially achromatic retarder to compensate beam traslationJ A WOOLLAM CO INC·Filed 2008·Granted Mar 15, 2011·94 cites·28 claims
- 0397US7460230B2Deviation angle self compensating substantially achromatic retarderJ A WOOLLAM CO INC·Filed 2006·Granted Dec 2, 2008·108 cites·21 claims
- 0497US7450231B2Deviation angle self compensating substantially achromatic retarderJ A WOOLLAM CO INC·Filed 2006·Granted Nov 11, 2008·105 cites·18 claims
- 0596US7616319B1Spectroscopic ellipsometer and polarimeter systemsJAMES D WELCH·Filed 2007·Granted Nov 10, 2009·117 cites·67 claims
- 0695US6937341B1System and method enabling simultaneous investigation of sample with two beams of electromagnetic radiationJ A WOOLLAM CO INC·Filed 2002·Granted Aug 30, 2005·96 cites·40 claims
- 0794US8736838B2Terahertz ellipsometer system, and method of useHERZINGER CRAIG M·Filed 2012·Granted May 27, 2014·13 cites·14 claims
- 0891US10073120B1Integrated vacuum-ultraviolet, mid and near-ultraviolet, visible, near, mid and far infrared and terahertz optical hall effect (OHE) instrument, and method of useJ A WOOLLAM CO INC·Filed 2017·Granted Sep 11, 2018·7 cites·26 claims
- 0991US9851294B1Integrated mid-infrared, far infrared and terahertz optical Hall effect (OHE) instrument, and method of useJ A WOOLLAM CO INC·Filed 2015·Granted Dec 26, 2017·9 cites·39 claims
- 1091US6982792B1Spectrophotometer, ellipsometer, polarimeter and the like systemsJ A WOOLLAM CO INC·Filed 2003·Granted Jan 3, 2006·49 cites·26 claims
- 1191US6456376B1Rotating compensator ellipsometer system with spatial filterJ A WOOLLAM CO INC·Filed 2001·Granted Sep 24, 2002·42 cites·37 claims
- 1290US8705032B2Terahertz-infrared ellipsometer system, and method of useHERZINGER CRAIG M·Filed 2013·Granted Apr 22, 2014·7 cites·21 claims
- 1390US8564777B1System and method for compensating detector non-idealitiesHERZINGER CRAIG M·Filed 2011·Granted Oct 22, 2013·8 cites·27 claims
- 1489US10175160B1Method to analyze spectroscopic ellipsometry or intensity data of porous samples utilizing the anisotropic bruggeman-effective medium theoryJ A WOOLLAM CO INC·Filed 2018·Granted Jan 8, 2019·5 cites·14 claims
- 1589US8416408B1Terahertz-infrared ellipsometer system, and method of useHERZINGER CRAIG M·Filed 2010·Granted Apr 9, 2013·8 cites·11 claims
- 1689US6353477B1Regression calibrated spectroscopic rotating compensator ellipsometer system with pseudo-achromatic retarder systemJ A WOOLLAM CO INC·Filed 2000·Granted Mar 5, 2002·39 cites·51 claims
- 1788US8248607B1Empirical correction for spectroscopic ellipsometric measurements of rough or textured surfacesHERZINGER CRAIG M·Filed 2010·Granted Aug 21, 2012·8 cites·14 claims
- 1887US9976902B1Method to analyze spectroscopic ellipsometry data of porous samples utilizing the anisotropic Bruggeman-effective medium theoryJ A WOOLLAM CO INC·Filed 2017·Granted May 22, 2018·6 cites·24 claims
- 1987US7468794B1Rotating compensator ellipsometer system with spatial filter equivalentJ A WOOLLAM CO INC·Filed 2005·Granted Dec 23, 2008·12 cites·29 claims
- 2087US6822738B1Spectroscopic rotating compensator ellipsometer system with pseudo-achromatic retarder systemJ A WOOLLAM CO INC·Filed 2001·Granted Nov 23, 2004·34 cites·44 claims
- 2186US10026167B1Method of obtaining micrographs of transparent or semi-transparent specimens using anisotropic contrastJ A WOOLLAM CO INC·Filed 2015·Granted Jul 17, 2018·6 cites·38 claims
- 2286US7336361B1Spectroscopic ellipsometer and polarimeter systemsJ A WOOLLAM CO INC·Filed 2005·Granted Feb 26, 2008·15 cites·26 claims
- 2385US7239391B2Method of analysis of multiple layer samplesJ A WOOLLAM CO INC·Filed 2005·Granted Jul 3, 2007·15 cites·28 claims
- 2485US5757494ASystem and method for improving data acquisition capability in spectroscopic ellipsometersJ A WOOLLAM CO INC·Filed 1995·Granted May 26, 1998·77 cites·31 claims
- 2584US5956145ASystem and method for improving data acquisition capability in spectroscopic rotatable element, rotating element, modulation element, and other ellipsometer and polarimeter and the like systemsJ A WOOLLAM CO INC·Filed 1998·Granted Sep 21, 1999·85 cites·21 claims
- 2683US5963327ATotal internal reflection electromagnetic radiation beam entry to, and exit from, ellipsometer, polarimeter, reflectometer and the like systemsJ A WOOLLAM CO INC·Filed 1998·Granted Oct 5, 1999·69 cites·19 claims
- 2782US10101265B1Birefringence imaging chromatography based on highly ordered 3D nanostructuresSCHUBERT MATHIAS M·Filed 2015·Granted Oct 16, 2018·3 cites·47 claims
- 2882US8169611B2Terahertz-infrared ellipsometer system, and method of useHERZINGER CRAIG M·Filed 2009·Granted May 1, 2012·10 cites·23 claims
- 2982US7304737B1Rotating or rotatable compensator system providing aberation corrected electromagnetic raadiation to a spot on a sample at multiple angles of a incidenceJ A WOOLLAM CO INC·Filed 2006·Granted Dec 4, 2007·8 cites·17 claims
- 3082US7158231B1Spectroscopic ellipsometer and polarimeter systemsJ A WOOLLAM CO INC·Filed 2003·Granted Jan 2, 2007·26 cites·28 claims
- 3182US7075649B1Discrete polarization state rotatable compensator spectroscopic ellipsometer system, and method of calibrationJ A WOOLLAM CO·Filed 2001·Granted Jul 11, 2006·19 cites·21 claims
- 3282US6804004B1Multiple-element lens systems and methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for lens retardance, in ellipometry and polarimetryJ A WOOLLAM CO INC·Filed 2000·Granted Oct 12, 2004·21 cites·30 claims
- 3382US6795184B1Odd bounce image rotation system in ellipsometer systemsJ A WOOLLAM CO INC·Filed 2001·Granted Sep 21, 2004·24 cites·10 claims
- 3481US10989601B1Beam focusing and reflective opticsJ A WOOLLAM CO INC·Filed 2020·Granted Apr 27, 2021·1 cites·17 claims
- 3581US5936734AAnalysis of partially polarized electromagnetic radiation in ellipsometer and polarimeter systemsJ A WOOLLAM CO INC·Filed 1997·Granted Aug 10, 1999·56 cites·18 claims
- 3680US7274450B1Sample entry purge system in spectrophotometer, ellipsometer, polarimeter and the like systemsJ A WOOLLAM CO INC·Filed 2004·Granted Sep 25, 2007·19 cites·9 claims
- 3780US5963325ADual vertically oriented triangular shaped optical retarder element for use in spectroscopic ellipsometer and polarimeter systemsJ A WOOLLAM CO INC·Filed 1999·Granted Oct 5, 1999·47 cites·9 claims
- 3879US7385697B2Sample analysis methodology utilizing electromagnetic radiationJ A WOOLLAM CO INC·Filed 2004·Granted Jun 10, 2008·19 cites·25 claims
- 3979US7245376B2Combined spatial filter and relay systems in rotating compensator ellipsometer/polarimeterJ A WOOLLAM CO INC·Filed 2005·Granted Jul 17, 2007·9 cites·33 claims
- 4079US7215424B1Broadband ellipsometer or polarimeter system including at least one multiple element lensJ A WOOLLAM CO INC·Filed 2005·Granted May 8, 2007·6 cites·23 claims
- 4178US7623237B1Sample investigating systemJ A WOOLLAM CO INC·Filed 2006·Granted Nov 24, 2009·5 cites·11 claims
- 4278US6084675AAdjustable beam alignment compensator/retarder with application in spectroscopic ellipsometer and polarimeter systemsJ A WOOLLAM CO INC·Filed 1999·Granted Jul 4, 2000·48 cites·13 claims
- 4377US7554662B1Spatial filter means comprising an aperture with a non-unity aspect ratio in a system for investigating samples with electromagnetic radiationJ A WOOLLAM CO INC·Filed 2006·Granted Jun 30, 2009·5 cites·20 claims
- 4476US9921352B1Biased fast axis retarder systemJ A WOOLLAM CO INC·Filed 2017·Granted Mar 20, 2018·2 cites·16 claims
- 4576US8462341B2Mounting for deviation angle self compensating substantially achromatic retarderHE PING·Filed 2011·Granted Jun 11, 2013·4 cites·29 claims
- 4676US7295313B1Application of intermediate wavelength band spectroscopic ellipsometry to in-situ real time fabrication of multiple layer alternating high/low refractive index filtersJ A WOOLLAM CO INC·Filed 2004·Granted Nov 13, 2007·12 cites·17 claims
- 4775US7349092B1System for reducing stress induced effects during determination of fluid optical constantsJ A WOOLLAM CO INC·Filed 2005·Granted Mar 25, 2008·4 cites·18 claims
- 4875US6034777AMethods for uncorrelated evaluation of parameters in parameterized mathematical model equations for window retardence, in ellipsometer and polarimeter systemsJ A WOOLLAM CO INC·Filed 1998·Granted Mar 7, 2000·45 cites·31 claims
- 4975US5946098AOptical elements for use in spectroscopic ellipsometer and polarimeter systemsJ A WOOLLAM CO INC·Filed 1997·Granted Aug 31, 1999·41 cites·14 claims
- 5073US7327456B1Spectrophotometer, ellipsometer, polarimeter and the like systemsJ A WOOLLAM CO INC·Filed 2005·Granted Feb 5, 2008·7 cites·9 claims
Showing the top 50 of 90 patent records by PatentIndex Score.
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