Inventor · disambiguated record
Kim Pierce
Also filed as: PIERCE KIM · PIERCE KIM M
15 granted patents·1,040 citations·filing 1996–2003
95Inventor score
Files withMICRON TECHNOLOGY INC15
Top patents by PatentIndex Score
15 records- 0198US5935263AMethod and apparatus for memory array compressed data testingMICRON TECHNOLOGY INC·Filed 1997·Granted Aug 10, 1999·503 cites·36 claims
- 0296US6365421B2Method and apparatus for storage of test results within an integrated circuitMICRON TECHNOLOGY INC·Filed 2000·Granted Apr 2, 2002·118 cites·41 claims
- 0394US6194738B1Method and apparatus for storage of test results within an integrated circuitMICRON TECHNOLOGY INC·Filed 1998·Granted Feb 27, 2001·102 cites·51 claims
- 0490US6178532B1On-chip circuit and method for testing memory devicesMICRON TECHNOLOGY INC·Filed 1998·Granted Jan 23, 2001·75 cites·29 claims
- 0590US5631862ASelf current limiting antifuse circuitMICRON TECHNOLOGY INC·Filed 1996·Granted May 20, 1997·73 cites·18 claims
- 0681US6546512B1Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuitMICRON TECHNOLOGY INC·Filed 2001·Granted Apr 8, 2003·19 cites·14 claims
- 0777US5706238ASelf current limiting antifuse circuitMICRON TECHNOLOGY INC·Filed 1997·Granted Jan 6, 1998·36 cites·12 claims
- 0874US6536004B2On-chip circuit and method for testing memory devicesMICRON TECHNOLOGY INC·Filed 2001·Granted Mar 18, 2003·19 cites·23 claims
- 0973US6185705B1Method and apparatus for checking the resistance of programmable elementsMICRON TECHNOLOGY INC·Filed 1997·Granted Feb 6, 2001·28 cites·27 claims
- 1071US5864565ASemiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuitMICRON TECHNOLOGY INC·Filed 1997·Granted Jan 26, 1999·25 cites·16 claims
- 1155US6983404B2Method and apparatus for checking the resistance of programmable elementsMICRON TECHNOLOGY INC·Filed 2001·Granted Jan 3, 2006·7 cites·21 claims
- 1253US6665827B2Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system for utilizing the semiconductor integrated circuitMICRON TECHNOLOGY INC·Filed 2003·Granted Dec 16, 2003·4 cites·11 claims
- 1349US6314538B1Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuitMICRON TECHNOLOGY INC·Filed 1998·Granted Nov 6, 2001·10 cites·24 claims
- 1449US6154410AMethod and apparatus for reducing antifuse programming timeMICRON TECHNOLOGY INC·Filed 1997·Granted Nov 28, 2000·11 cites·12 claims
- 1546US5982656AMethod and apparatus for checking the resistance of programmable elementsMICRON TECHNOLOGY INC·Filed 1997·Granted Nov 9, 1999·10 cites·34 claims
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