Inventor · disambiguated record
Byron Harry Gibbs
Also filed as: GIBBS BYRON · GIBBS BYRON H · GIBBS BYRON HARRY
7 granted patents·2 pending applications·54 citations·filing 2004–2021
80Inventor score
Top patents by PatentIndex Score
9 records- 0191US7068056B1System and method for the probing of a waferTEXAS INSTRUMENTS INC·Filed 2005·Granted Jun 27, 2006·42 cites·20 claims
- 0272US7474089B2Contact mechanism cleaningTEXAS INSTRUMENTS INC·Filed 2006·Granted Jan 6, 2009·7 cites·18 claims
- 0363US2022108896A1Testing semiconductor componentsTEXAS INSTRUMENTS INC·Filed 2021·Application pending·0 cites
- 0461US11201065B2Testing semiconductor componentsTEXAS INSTRUMENTS INC·Filed 2020·Granted Dec 14, 2021·0 cites·15 claims
- 0557US8912810B2Contactor with multi-pin device contactsHSU STANLEY·Filed 2011·Granted Dec 16, 2014·2 cites·6 claims
- 0655US7772830B2Test handler automatic contactor cleaner methods and surrogate cleaning deviceTEXAS INSTRUMENTS INC·Filed 2006·Granted Aug 10, 2010·2 cites·13 claims
- 0754US11676829B2Hyperbaric saw for sawing packaged devicesTEXAS INSTRUMENTS INC·Filed 2020·Granted Jun 13, 2023·0 cites·6 claims
- 0844US8994397B2Thermal pad shorts test for wire bonded strip testingGIBBS BYRON HARRY·Filed 2011·Granted Mar 31, 2015·1 cites·8 claims
- 0931US2006071679A1System and method for the probing of a waferTEXAS INSTRUMENTS INC·Filed 2004·Application pending·0 cites
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