Inventor · disambiguated record
Bor-Doou Rong
Also filed as: RONG BOR-DOOU
28 granted patents·5 pending applications·205 citations·filing 1996–2024
96Inventor score
Top patents by PatentIndex Score
33 records- 0186US7292494B2Internal power management scheme for a memory chip in deep power down modeETRON TECHNOLOGY INC·Filed 2006·Granted Nov 6, 2007·15 cites·13 claims
- 0281US7031219B2Internal power management scheme for a memory chip in deep power down modeETRON TECHNOLOGY INC·Filed 2004·Granted Apr 18, 2006·25 cites·30 claims
- 0374US7515669B2Dynamic input setup/hold time improvement architectureETRON TECHNOLOGY INC·Filed 2005·Granted Apr 7, 2009·6 cites·23 claims
- 0473US9214448B2Bundled memory and manufacture method for a bundled memory with an external input/output busETRON TECHNOLOGY INC·Filed 2014·Granted Dec 15, 2015·2 cites·4 claims
- 0570US9601456B2System-in-package module and manufacture method for a system-in-package moduleETRON TECH INC·Filed 2015·Granted Mar 21, 2017·2 cites·12 claims
- 0670US6661719B1Wafer level burn-in for memory integrated circuitETRON TECHNOLOGY INC·Filed 2002·Granted Dec 9, 2003·17 cites·25 claims
- 0770US2024363156A1Dynamic memory with sustainable storage architecture and clean up circuitETRON TECH INC·Filed 2024·Application pending·0 cites
- 0867US6643166B1Low power SRAM redundancy repair schemeETRON TECHNOLOGY INC·Filed 2001·Granted Nov 4, 2003·15 cites·13 claims
- 0966US6101138AArea efficient global row redundancy scheme for DRAMETRON TECHNOLOGY INC·Filed 1999·Granted Aug 8, 2000·24 cites·15 claims
- 1066US2023420028A1Dynamic memory with long retention timeETRON TECH INC·Filed 2023·Application pending·0 cites
- 1163US11798613B2Dynamic memory with long retention timeETRON TECH INC·Filed 2021·Granted Oct 24, 2023·0 cites·4 claims
- 1262US6377492B1Memory architecture for read and write at the same time using a conventional cellETRON TECHNOLOGY INC·Filed 2001·Granted Apr 23, 2002·14 cites·10 claims
- 1361US12068020B2Dynamic memory with sustainable storage architecture and clean up circuitETRON TECH INC·Filed 2022·Granted Aug 20, 2024·0 cites·23 claims
- 1461US7098722B2Low power design for fuse control circuitETRON TECHNOLOGY INC·Filed 2004·Granted Aug 29, 2006·12 cites·12 claims
- 1560US7434985B2Calibrated built-in temperature sensor and calibration method thereofETRON TECHNOLOGY INC·Filed 2005·Granted Oct 14, 2008·4 cites·14 claims
- 1659US5723994ALevel boost restoration circuitETRON TECHNOLOGY INC·Filed 1996·Granted Mar 3, 1998·16 cites·17 claims
- 1758US7478294B2Time controllable sensing scheme for sense amplifier in memory IC testETRON TECHNOLOGY INC·Filed 2005·Granted Jan 13, 2009·4 cites·13 claims
- 1854US9070558B2Bundled memory and manufacture method for a bundled memory with an external input/output busETRON TECHNOLOGY INC·Filed 2013·Granted Jun 30, 2015·0 cites·7 claims
- 1953US9589931B2Bundled memory and manufacture method for a bundled memory with an external input/output busETRON TECH INC·Filed 2015·Granted Mar 7, 2017·0 cites·1 claims
- 2053US6934899B2Variable self-time scheme for write recovery by low speed testerETRON TECHNOLOGY INC·Filed 2002·Granted Aug 23, 2005·8 cites·18 claims
- 2151US6237115B1Design for testability in very high speed memoryETRON TECHNOLOGY INC·Filed 1999·Granted May 22, 2001·12 cites·13 claims
- 2249US12354646B2Dynamic memory with sustainable storage architectureETRON TECH INC·Filed 2022·Granted Jul 8, 2025·0 cites·6 claims
- 2349US5703832AtRAS protection circuitETRON TECHNOLOGY INC·Filed 1997·Granted Dec 30, 1997·14 cites·18 claims
- 2446US9465430B2Memory with variable operation voltage and the adjusting method thereofIND TECH RES INST·Filed 2014·Granted Oct 11, 2016·0 cites·13 claims
- 2544US12361998B2Sustainable DRAM having principle power supply voltage unified with logic circuitETRON TECH INC·Filed 2021·Granted Jul 15, 2025·0 cites·22 claims
- 2641US11302383B2Dynamic memory with sustainable storage architectureETRON TECH INC·Filed 2019·Granted Apr 12, 2022·0 cites·1 claims
- 2741US6058069AProtection circuit to ensure DRAM signal in write cycleETRON TECHNOLOGY INC·Filed 1999·Granted May 2, 2000·8 cites·15 claims
- 2840US2006028228A1Test pads for IC chipRONG BOR-DOOU·Filed 2004·Application pending·0 cites
- 2939US2008202800A1Re-routing method and the circuit thereofKUO MING-HONG·Filed 2008·Application pending·0 cites
- 3038US7983102B2Data detecting apparatus and methods thereofETRON TECHNOLOGY INC·Filed 2009·Granted Jul 19, 2011·0 cites·11 claims
- 3135US5737271ASemiconductor memory arraysETRON TECHNOLOGY INC·Filed 1997·Granted Apr 7, 1998·4 cites·12 claims
- 3235US2006284635A1Re-routing method and the circuit thereofKUO MING-HONG·Filed 2006·Application pending·0 cites
- 3333US5671189ALow standby power redundancy circuitETRON TECHNOLOGY INC·Filed 1996·Granted Sep 23, 1997·3 cites·14 claims
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