Inventor · disambiguated record
Geert Vandenhoudt
Also filed as: VANDENHOUDT GEERT
1 granted patent·2 pending applications·5 citations·filing 2012–2017
26Inventor score
Top patents by PatentIndex Score
3 records- 0169US9696146B2Optical scanning probeNIKON METROLOGY NV·Filed 2013·Granted Jul 4, 2017·5 cites·19 claims
- 0239US2018135969A1System for measuring the position and movement of an objectNIKON METROLOGY N V·Filed 2017·Application pending·0 cites
- 0327US2014043622A1System for measuring the position and movement of an objectVANDENHOUDT GEERT·Filed 2012·Application pending·0 cites
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