Inventor · disambiguated record
Yasuhiro Yoshiura
Also filed as: YOSHIURA YASUHIRO
10 granted patents·3 pending applications·10 citations·filing 2008–2024
80Inventor score
Top patents by PatentIndex Score
13 records- 0184US12426301B2Semiconductor device and method of manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2022·Granted Sep 23, 2025·1 cites·12 claims
- 0275US9257541B2High-breakdown-voltage power semiconductor device having a diodeMITSUBISHI ELECTRIC CORP·Filed 2013·Granted Feb 9, 2016·4 cites·9 claims
- 0369US9455355B2Semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2013·Granted Sep 27, 2016·3 cites·4 claims
- 0468US9401314B2Method of testing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2014·Granted Jul 26, 2016·2 cites·14 claims
- 0557US2025072083A1Semiconductor device and method of manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2024·Application pending·0 cites
- 0648US9755037B2Semiconductor device and method of manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2014·Granted Sep 5, 2017·0 cites·4 claims
- 0747US9704946B2Semiconductor device including a diode and guard ringMITSUBISHI ELECTRIC CORP·Filed 2015·Granted Jul 11, 2017·0 cites·3 claims
- 0847US2009289276A1Semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2008·Application pending·0 cites
- 0941US9159563B2Semiconductor device manufacturing method and semiconductor manufacturing apparatusTERASHIMA TOMOHIDE·Filed 2012·Granted Oct 13, 2015·0 cites·5 claims
- 1040US2014232004A1Semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2013·Application pending·0 cites
- 1136US10811511B2Method of manufacturing semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2016·Granted Oct 20, 2020·0 cites·12 claims
- 1233US10340133B2Method for fabricating semiconductor deviceMITSUBISHI ELECTRIC CORP·Filed 2015·Granted Jul 2, 2019·0 cites·8 claims
- 1333US8698250B2Semiconductor deviceKACHI TAKAO·Filed 2012·Granted Apr 15, 2014·0 cites·4 claims
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