Inventor · disambiguated record
Felix Wewers
Also filed as: WEWERS FELIX
2 granted patents·23 citations·filing 2005–2005
60Inventor score
Top patents by PatentIndex Score
2 records- 0174US8531329B2Method and device for determining the thickness of material using high frequencyMAHLER MICHAEL·Filed 2005·Granted Sep 10, 2013·10 cites·11 claims
- 0273US7605743B2Method and device for a material-penetrative localization of a measurement signalBOSCH GMBH ROBERT·Filed 2005·Granted Oct 20, 2009·13 cites·14 claims
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