Inventor · disambiguated record

Takayuki Nakashiro

Also filed as: NAKASHIRO TAKAYUKI

2 granted patents·0 citations·filing 2009–2011

22Inventor score

Technology areasH10P

Files withMARUYAMA YUJI2

Top patents by PatentIndex Score

2 records

0141US8159250B2Testing device for testing a semiconductor deviceMARUYAMA YUJI·Filed 2009·Granted Apr 17, 2012·0 cites·6 claims
0230US8648617B2Semiconductor device and method of testing semiconductor deviceMARUYAMA YUJI·Filed 2011·Granted Feb 11, 2014·0 cites·13 claims

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →