Inventor · disambiguated record
Upendra S. Brahme
Also filed as: BRAHME UPENDRA · BRAHME UPENDRA S
3 granted patents·112 citations·filing 1991–2002
75Inventor score
Top patents by PatentIndex Score
3 records- 0183US5175495ADetection of semiconductor failures by photoemission and electron beam testingLSI LOGIC CORP·Filed 1991·Granted Dec 29, 1992·60 cites·8 claims
- 0259US7010734B2Method for microprocessor test insertion reductionSUN MICROSYSTEMS INC·Filed 2002·Granted Mar 7, 2006·14 cites·11 claims
- 0352US5878050AMethod and apparatus for data compare detection of memory errors on a computers memory subsystemSUN MICROSYSTEMS INC·Filed 1997·Granted Mar 2, 1999·38 cites·20 claims
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