Inventor · disambiguated record
Min-Wei Hung
Also filed as: HUNG MIN-WEI
12 granted patents·2 pending applications·23 citations·filing 2008–2020
84Inventor score
Files withNAT APPLIED RES LABORATORIES8NAT UNIV TSING HUA2HUNG MIN-WEI1TSAI HSIN-YI1UNIV NAT TAIWAN NORMAL1
Top patents by PatentIndex Score
14 records- 0190US8643833B1System for inspecting surface defects of a specimen and a method thereofHUNG MIN-WEI·Filed 2012·Granted Feb 4, 2014·16 cites·16 claims
- 0273US10180374B1Test device and method for testing contact lens and test device for testing hydrous elementNAT APPLIED RES LABORATORIES·Filed 2017·Granted Jan 15, 2019·1 cites·20 claims
- 0363US8956009B2Apparatus and methods for controlling a three-dimensional optical fieldYEH JERLIANG·Filed 2011·Granted Feb 17, 2015·4 cites·7 claims
- 0461US9348397B2Method of power management, portable system and portable power bankUNIV NAT TAIWAN NORMAL·Filed 2014·Granted May 24, 2016·2 cites·12 claims
- 0556US9255884B2Fluorescence strip, fluorescence excitation device and portable fluorescence analysis system with the sameNAT UNIV TSING HUA·Filed 2014·Granted Feb 9, 2016·0 cites·20 claims
- 0655US9689869B2Fluorescence excitation device and portable fluorescence analysis system with the sameNAT UNIV TSING HUA·Filed 2015·Granted Jun 27, 2017·0 cites·35 claims
- 0752US10942456B1Device of light source with diode array emitting high-uniformity ultravioletNAT APPLIED RES LABORATORIES·Filed 2020·Granted Mar 9, 2021·0 cites·6 claims
- 0850US10928247B2System and method for detecting illuminance having a light sensor comprising a light emitting diode receiving a ray of light and generating a sensing voltageNAT APPLIED RES LABORATORIES·Filed 2019·Granted Feb 23, 2021·0 cites·24 claims
- 0948US2009120251A1Machining method and apparatus for brittle materialNAT APPLIED RES LABORATORIES·Filed 2008·Application pending·0 cites
- 1041US10086559B2System for online monitoring powder-based 3D printing processes and method thereofNAT APPLIED RES LABORATORIES·Filed 2015·Granted Oct 2, 2018·0 cites·12 claims
- 1141US8643836B1Inspection method for inspecting defects of wafer surfaceTSAI HSIN-YI·Filed 2012·Granted Feb 4, 2014·0 cites·6 claims
- 1239US10912948B2Composite intelligent biological phototherapy deviceNAT APPLIED RES LABORATORIES·Filed 2018·Granted Feb 9, 2021·0 cites·17 claims
- 1339US2013265331A1Virtual Reality Telescopic Observation System of Intelligent Electronic Device and Method ThereofNAT APPLIED RES LABORATORIES·Filed 2013·Application pending·0 cites
- 1430US9600880B2Method and system for qualifying a surgical clip applierNAT APPLIED RES LABORATORIES·Filed 2015·Granted Mar 21, 2017·0 cites·11 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →