Inventor · disambiguated record
Charles K. Harris
Also filed as: HARRIS CHARLES · HARRIS CHARLES K · HARRIS CHARLES KENNETH · HARRIS JR CHARLES K
14 granted patents·2 pending applications·423 citations·filing 1990–2003
94Inventor score
Files withTEXAS INSTRUMENTS INC6SEMICONDUCTOR TECH & INSTR INC4AVERY DENNISON CORP2AUGUST TECHNOLOGY CORP1ISOA INC1
Top patents by PatentIndex Score
16 records- 0193US5220400AContainer inspection systemTEXAS INSTRUMENTS INC·Filed 1990·Granted Jun 15, 1993·115 cites·9 claims
- 0282US6761498B1Binder construction for easy insertion and removal of spine labelAVERY DENNISON CORP·Filed 2003·Granted Jul 13, 2004·21 cites·22 claims
- 0381US5956134AInspection system and method for leads of semiconductor devicesSEMICONDUCTOR TECH & INSTR INC·Filed 1998·Granted Sep 21, 1999·68 cites·30 claims
- 0480US6902340B2Binder construction for easy insertion and removal of spine labelAVERY DENNISON CORP·Filed 2003·Granted Jun 7, 2005·21 cites·20 claims
- 0577US7024031B1System and method for inspection using off-angle lightingAUGUST TECHNOLOGY CORP·Filed 2001·Granted Apr 4, 2006·20 cites·25 claims
- 0673US6292260B1System and method of optically inspecting surface structures on an objectISOA INC·Filed 1999·Granted Sep 18, 2001·49 cites·15 claims
- 0772US6765666B1System and method for inspecting bumped wafersSEMICONDUCTOR TECH & INSTR INC·Filed 2000·Granted Jul 20, 2004·18 cites·18 claims
- 0870US6252981B1System and method for selection of a reference dieSEMICONDUCTOR TECH & INSTR INC·Filed 1999·Granted Jun 26, 2001·41 cites·26 claims
- 0952US5414458ASemiconductor device lead inspection systemTEXAS INSTRUMENTS INC·Filed 1993·Granted May 9, 1995·19 cites·9 claims
- 1051US5987161AApparatus and method for identifying defective objectsTEXAS INSTRUMENTS INC·Filed 1994·Granted Nov 16, 1999·20 cites·20 claims
- 1148US5402505ASemiconductor device lead inspection systemTEXAS INSTRUMENTS INC·Filed 1993·Granted Mar 28, 1995·17 cites·11 claims
- 1241US6128034AHigh speed lead inspection systemSEMICONDUCTOR TECH & INSTR INC·Filed 1994·Granted Oct 3, 2000·10 cites·17 claims
- 1339US2001028734A1System and method for selection of a reference dieFiled 2001·Application pending·0 cites
- 1432US2004086198A1System and method for bump height measurementFiled 2002·Application pending·0 cites
- 1531US6042247AEfficient hybrid illuminatorTEXAS INSTRUMENTS INC·Filed 1998·Granted Mar 28, 2000·2 cites·20 claims
- 1630US6292580B1Efficient illumination system for wire bondersTEXAS INSTRUMENTS INC·Filed 1998·Granted Sep 18, 2001·2 cites·20 claims
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