Inventor · disambiguated record
Yasuhiro Sugawara
Also filed as: SUGAWARA YASUHIRO
20 granted patents·2 pending applications·417 citations·filing 1991–2023
95Inventor score
Files withHITACHI LTD8CANON MEDICAL SYSTEMS CORP3TOSHIBA MEDICAL SYS CORP3OLYMPUS OPTICAL CO2TOSHIBA KK2
Top patents by PatentIndex Score
22 records- 0193US5289004AScanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination lightOLYMPUS OPTICAL CO·Filed 1992·Granted Feb 22, 1994·154 cites·19 claims
- 0283US6724855B2X-ray flat panel detectorTOSHIBA KK·Filed 2002·Granted Apr 20, 2004·25 cites·20 claims
- 0383US6507026B2Planar X-ray detectorTOSHIBA KK·Filed 2001·Granted Jan 14, 2003·36 cites·12 claims
- 0478US10178977B2X-ray diagnostic apparatus and image processing apparatusTOSHIBA MEDICAL SYS CORP·Filed 2015·Granted Jan 15, 2019·3 cites·19 claims
- 0578US5296729ASemiconductor memory device having static random access memoryHITACHI LTD·Filed 1991·Granted Mar 22, 1994·48 cites·4 claims
- 0669US12336850B2X-ray diagnostic apparatus and tomosynthesis imaging methodCANON MEDICAL SYSTEMS CORP·Filed 2022·Granted Jun 24, 2025·0 cites·20 claims
- 0769US6717202B2HSG semiconductor capacitor with migration inhibition layerRENESAS TECH CORP·Filed 2002·Granted Apr 6, 2004·15 cites·25 claims
- 0865US6097197AScanning probe microscopeOLYMPUS OPTICAL CO·Filed 1997·Granted Aug 1, 2000·34 cites·13 claims
- 0964US6576946B1Semiconductor device comprising capacitor cells, bit lines, word lines, and MOS transistors in a memory cell area over a semiconductor substrateHITACHI LTD·Filed 1999·Granted Jun 10, 2003·24 cites·6 claims
- 1063US6544834B1Method of forming a semiconductor device including a capacitor with tantalum oxide (Ta2O5)HITACHI LTD·Filed 1999·Granted Apr 8, 2003·26 cites·32 claims
- 1160US6627497B2Semiconductor integrated circuit device and method of manufacturing the sameHITACHI LTD·Filed 2002·Granted Sep 30, 2003·7 cites·30 claims
- 1259US11835548B2Vibration component measurement device, Kelvin probe force microscope, and vibration component measurement methodUNIV OSAKA·Filed 2021·Granted Dec 5, 2023·0 cites·20 claims
- 1358US9978163B2Exposure management systemTOSHIBA MEDICAL SYS CORP·Filed 2015·Granted May 22, 2018·1 cites·11 claims
- 1458US6524927B1Semiconductor device and method of fabricating the sameHITACHI LTD·Filed 1999·Granted Feb 25, 2003·17 cites·21 claims
- 1557US11810003B2Learning tree output node selection using a measure of node reliabilityNATIONAL UNIV CORPORATION IWATE UNIV·Filed 2018·Granted Nov 7, 2023·1 cites·10 claims
- 1655US12208935B2Wrap replacing apparatusCANON MEDICAL SYSTEMS CORP·Filed 2021·Granted Jan 28, 2025·0 cites·14 claims
- 1754US2024156428A1X-ray diagnosis apparatusCANON MEDICAL SYSTEMS CORP·Filed 2023·Application pending·0 cites
- 1853US8351346B2Communication deviceALLIED TELESIS HOLDINGS KK·Filed 2008·Granted Jan 8, 2013·1 cites·8 claims
- 1951US6713343B2Method of forming a semiconductor device with a capacitor including a polycrystalline tantalum oxide film dielectricHITACHI LTD·Filed 2003·Granted Mar 30, 2004·3 cites·28 claims
- 2047US5655067AAnimation generating method in a design supporting systemHITACHI LTD·Filed 1994·Granted Aug 5, 1997·16 cites·16 claims
- 2141US2014193082A1Image processing apparatus and methodTOSHIBA MEDICAL SYS CORP·Filed 2014·Application pending·0 cites
- 2237US6583463B1Semiconductor integrated circuit device with information storage capacitor having ruthenium dioxide lower electrode and crystallized TA2O5 capacitor insulatorHITACHI LTD·Filed 1998·Granted Jun 24, 2003·6 cites·15 claims
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