Inventor · disambiguated record
Blane Holden
Also filed as: HOLDEN BLANE
3 granted patents·56 citations·filing 1997–2000
72Inventor score
Files withMICRON TECHNOLOGY INC3
Top patents by PatentIndex Score
3 records- 0174US6256593B1System for evaluating and reporting semiconductor test processesMICRON TECHNOLOGY INC·Filed 2000·Granted Jul 3, 2001·19 cites·25 claims
- 0267US6113646AMethod of selecting layout of integrated circuit probe cardMICRON TECHNOLOGY INC·Filed 1997·Granted Sep 5, 2000·34 cites·15 claims
- 0329US6070131ASystem for evaluating and reporting semiconductor test processesMICRON TECHNOLOGY INC·Filed 1997·Granted May 30, 2000·3 cites·18 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →