Inventor · disambiguated record
Fritz J. Hohn
Also filed as: HOHN FRITZ J · HOHN FRITZ JUERGEN · HOHN FRITZ-JURGEN
9 granted patents·221 citations·filing 1981–1991
90Inventor score
Files withIBM9
Top patents by PatentIndex Score
9 records- 0183US4468586AShaped electron emission from single crystal lanthanum hexaboride with intensity distributionIBM·Filed 1981·Granted Aug 28, 1984·33 cites·57 claims
- 0278US4843330AElectron beam contactless testing system with grid bias switchingIBM·Filed 1986·Granted Jun 27, 1989·35 cites·13 claims
- 0375US4943769AApparatus and method for opens/shorts testing of capacitively coupled networks in substrates using electron beamsIBM·Filed 1989·Granted Jul 24, 1990·34 cites·5 claims
- 0474US5150392AX-ray mask containing a cantilevered tip for gap control and alignmentIBM·Filed 1991·Granted Sep 22, 1992·28 cites·5 claims
- 0574US4486684ASingle crystal lanthanum hexaboride electron beam emitter having high brightnessIBM·Filed 1981·Granted Dec 4, 1984·20 cites·18 claims
- 0673US4871919AElectron beam lithography alignment using electric field changes to achieve registrationIBM·Filed 1988·Granted Oct 3, 1989·18 cites·12 claims
- 0766US5057773AMethod for opens/shorts testing of capacitively coupled networks in substrates using electron beamsIBM·Filed 1990·Granted Oct 15, 1991·29 cites·3 claims
- 0863US4426583AElectron beam potential switching apparatusIBM·Filed 1982·Granted Jan 17, 1984·12 cites·9 claims
- 0952US4621232AInspection of unsintered single layer or multilayer ceramics using a broad area electrical contacting structureIBM·Filed 1984·Granted Nov 4, 1986·12 cites·3 claims
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