Inventor · disambiguated record

Yuzo Katsuki

Also filed as: KATSUKI YUZO

1 granted patent·14 citations·filing 2002–2002

36Inventor score

Technology areasG01N

Files withTOKYO SEIMITSU CO LTD1

Top patents by PatentIndex Score

1 record

0167US6867424B2Wafer defect inspection machine having a dual illumination systemTOKYO SEIMITSU CO LTD·Filed 2002·Granted Mar 15, 2005·14 cites·5 claims

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Yuzo Katsuki — Patent Inventor | PatentIndex