Inventor · disambiguated record
Seongsil Lee
Also filed as: LEE SEONGSIL
2 granted patents·2 pending applications·6 citations·filing 2016–2024
50Inventor score
Files withSAMSUNG ELECTRONICS CO LTD4
Top patents by PatentIndex Score
4 records- 0183US10067067B2Substrate inspection apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Sep 4, 2018·4 cites·19 claims
- 0269US10393672B2System and method of inspecting substrate and method of fabricating semiconductor device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Aug 27, 2019·2 cites·20 claims
- 0359US2025290860A1Optical inspection apparatus, optical inspection method, and optical inspection system including optical inspection apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0457US2025027875A1Optical imaging deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →