Inventor · disambiguated record
Chae Yoon Lee
Also filed as: LEE CHAE YOON
7 granted patents·4 pending applications·35 citations·filing 2000–2020
81Inventor score
Top patents by PatentIndex Score
11 records- 0185US9201093B2Inspection apparatus for semiconductor deviceLEE CHAE-YOON·Filed 2011·Granted Dec 1, 2015·10 cites·10 claims
- 0284US9128120B2ProbeLEE CHAE YOON·Filed 2010·Granted Sep 8, 2015·8 cites·5 claims
- 0379US8228086B2Socket for testing semiconductor chipLEE CHAE YOON·Filed 2010·Granted Jul 24, 2012·6 cites·19 claims
- 0457US11563249B2Battery pack system including multi-batterySK ON CO LTD·Filed 2020·Granted Jan 24, 2023·0 cites·7 claims
- 0552US7253647B2Probe for high electric currentLEE CHAE YOON·Filed 2004·Granted Aug 7, 2007·7 cites·4 claims
- 0643US9250264B2Coaxial probeLEE CHAE-YOON·Filed 2012·Granted Feb 2, 2016·0 cites·14 claims
- 0742US6350153B1Electrical connector for connecting an integrated circuit to a printed circuit boardLEENO IND INC·Filed 2000·Granted Feb 26, 2002·4 cites·5 claims
- 0839US2015123687A1Test probe and machining method thereofLEENO IND INC·Filed 2013·Application pending·0 cites
- 0938US2012105090A1Probe device for testingLEE CHAE YOON·Filed 2009·Application pending·0 cites
- 1038US2008036484A1Test probe and manufacturing method thereofLEENO IND INC·Filed 2007·Application pending·0 cites
- 1136US2008180125A1Contact Probe And Socket For Testing Semiconductor ChipsLEENO IND INC·Filed 2007·Application pending·0 cites
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