Inventor

SHARMA MANISH

US304 patents

⚠️ This page may combine multiple inventors who share the name “SHARMA MANISH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SHARMA MANISH

HEWLETT PACKARD DEVELOPMENT CO

Directional ion etching process for patterning self-aligned via contacts

Magnetic memory device having soft reference layer

Pressure-sensitive input device for data processing systems

Cross point resistive memory array

Magnetic memory device

Multi-bit magnetic memory device

Magneto resistive storage device having double tunnel junction

Magneto-resistive device having soft reference layer

Read methods for magneto-resistive device having soft reference layer

Method and system for printing user data to form documents

Non-volatile memory module for use in a computer system

Coupled ferromagnetic systems having modified interfaces

Method of making toroidal MRAM cells

Magnetoresistive element including ferromagnetic sublayer having smoothed surface

Process for making angled features for nanolithography and nanoimprinting

Diode for use in MRAM devices and method of manufacture

Magnetic memory storage device

Thermal-assisted nanotip magnetic memory storage device

Magnetic memory devices having multiple bits per memory cell

Integrated digitizing tablet and display apparatus and method of operation

Asymmetric patterned magnetic memory

Read operations on multi-bit memory cells in resistive cross point arrays

Magneto-resistive device including clad conductor

Printed circuit board printing system and method using liquid electrophotographic printing

Shared volatile and non-volatile memory

Magnetic shielding for reducing magnetic interference

T NETIX INC

Subword-based speaker verification using multiple-classifier fusion, with channel, fusion, model and threshold adaptation

System and method for detecting a recorded voice

Blind clustering of data with application to speech processing systems

HEWLETT PACKARD CO

Memory device having memory cells capable of four states

Memory device having memory cells with magnetic tunnel junction and tunnel junction in series

Magneto-resistive device including soft reference layer having embedded conductors

TOSHIBA KK

Optical wavelength division multiplexed network system

Multi-wavelength light source

Optical network analyzer for measuring the amplitude characteristics and group delay time dispersion characteristics of an optical circuit device

CHENG WU-TUNG

Direct fault diagnostics using per-pattern compactor signatures

Removing the effects of unknown test values from compacted test responses

Removing the effects of unknown test values from compacted test responses

(unassigned)

Subword-based speaker verification with multiple-classifier score fusion weight and threshold adaptation

Cladded read conductor for a pinned-on-the-fly soft reference layer

KAO CORP

Apparatus and method for cutting web

Apparatus and method for cutting web

RAJSKI JANUSZ

Determining and analyzing integrated circuit yield and quality

BIRECKI HENRYK

Test subject monitoring device

HEWLETT PACKARD COMPANY INTELL

Cladded read-write conductor for a pinned-on-the-fly soft reference layer

UNIV RUTGERS

Speaker verification system using decision fusion logic

AGILENT TECHNOLOGIES INC

Method and apparatus for measuring the quality of delay test patterns

NEW FOCUS INC

Method and apparatus for aligning fiber optics with optical elements

MENTOR GRAPHICS CORP

Fault dictionaries for integrated circuit yield and quality analysis methods and systems

AVAGO TECHNOLOGIES GENERAL IP

Method for determining the impact on test coverage of scan chain parallelization by analysis of a test set for independently accessible flip-flops