Inventor · disambiguated record
Shin Ho Chu
Also filed as: CHU SHIN H · CHU SHIN HO
30 granted patents·4 pending applications·170 citations·filing 1999–2013
96Inventor score
Top patents by PatentIndex Score
34 records- 0191US8023347B2Anti-fuse repair control circuit and semiconductor device including DRAM having the sameHYNIX SEMICONDUCTOR INC·Filed 2010·Granted Sep 20, 2011·15 cites·16 claims
- 0288US6215710B1Apparatus and method for controlling data strobe signal in DDR SDRAMHYUNDAI ELECTRONICS IND·Filed 1999·Granted Apr 10, 2001·74 cites·6 claims
- 0386US8192082B2Thermal data output circuit and multi chip package using the sameSONG HO UK·Filed 2008·Granted Jun 5, 2012·17 cites·11 claims
- 0477US7688663B2Anti-fuse repair control circuit and semiconductor device including DRAM having the sameHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Mar 30, 2010·9 cites·16 claims
- 0575US7606105B2Deep power down mode control circuitHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Oct 20, 2009·9 cites·11 claims
- 0672US7554871B2Semiconductor memory apparatusHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Jun 30, 2009·4 cites·22 claims
- 0770US7693003B2Semiconductor packageHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Apr 6, 2010·4 cites·13 claims
- 0870US7580310B2Self refresh control deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Aug 25, 2009·6 cites·23 claims
- 0961US8400846B2Semiconductor integrated circuit with multi testCHU SHIN HO·Filed 2011·Granted Mar 19, 2013·2 cites·18 claims
- 1060US7710809B2Self refresh operation of semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted May 4, 2010·3 cites·5 claims
- 1158US8767489B2Semiconductor memory device for improving repair efficiencyLEE MYUNG HWAN·Filed 2012·Granted Jul 1, 2014·2 cites·17 claims
- 1257US8331170B2Data transfer circuit, method thereof, and memory device including data transfer circuitCHU SHIN-HO·Filed 2010·Granted Dec 11, 2012·2 cites·17 claims
- 1355US9025410B2Semiconductor memory devices and semiconductor system having parameters, and methods of testing the sameSK HYNIX INC·Filed 2013·Granted May 5, 2015·1 cites·23 claims
- 1455US7800431B2Internal voltage generation circuitHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Sep 21, 2010·3 cites·11 claims
- 1553US7773402B2Semiconductor memory apparatusHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Aug 10, 2010·0 cites·8 claims
- 1652US7368953B2BufferHYNIX SEMICONDUCTOR INC·Filed 2006·Granted May 6, 2008·2 cites·12 claims
- 1751US7902902B2Anti-fuse repair control circuit for preventing stress on circuit partsHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Mar 8, 2011·4 cites·18 claims
- 1851US7274619B2Wordline enable circuit in semiconductor memory device and method thereofHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Sep 25, 2007·2 cites·10 claims
- 1949US7940115B2Fuse circuit for semiconductor integrated circuit and control method of the sameHYNIX SEMICONDUCTOR INC·Filed 2008·Granted May 10, 2011·0 cites·10 claims
- 2048US7126865B2Memory device including parallel test circuitHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Oct 24, 2006·5 cites·5 claims
- 2146US7447097B2TRAS adjusting circuit for self-refresh mode in a semiconductor deviceHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Nov 4, 2008·1 cites·20 claims
- 2243US8000163B2Self refresh operation of semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2010·Granted Aug 16, 2011·0 cites·2 claims
- 2343US8000164B2Self refresh operation of semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2010·Granted Aug 16, 2011·0 cites·18 claims
- 2442US8045408B2Semiconductor integrated circuit with multi testHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Oct 25, 2011·0 cites·19 claims
- 2541US8917572B2Semiconductor memory device and method of testing the sameSK HYNIX INC·Filed 2012·Granted Dec 23, 2014·0 cites·32 claims
- 2641US8749270B2Driver circuit of semiconductor apparatus and method for controlling the sameLEE MYUNG HWAN·Filed 2011·Granted Jun 10, 2014·0 cites·3 claims
- 2739US7327626B2Self refresh control deviceHYNIX SEMICONDUCTOR INC·Filed 2005·Granted Feb 5, 2008·0 cites·23 claims
- 2838US8588013B2Address decoding method and semiconductor memory device using the sameCHU SHIN HO·Filed 2011·Granted Nov 19, 2013·0 cites·15 claims
- 2937US9368237B2Semiconductor integrated circuit capable of controlling test modes without stopping testAN SUN MO·Filed 2009·Granted Jun 14, 2016·0 cites·4 claims
- 3037US6154397ASemiconductor memory device having stabilization circuit for stable signal transmissionHYUNDAI ELECTRONICS IND·Filed 1999·Granted Nov 28, 2000·5 cites·6 claims
- 3137US2012081823A1Protection circuit of semiconductor apparatusCHU SHIN HO·Filed 2011·Application pending·0 cites
- 3237US2009059691A1Semiconductor integrated circuit and multi test method thereofHYNIX SEMICONDUCTOR INC·Filed 2008·Application pending·0 cites
- 3334US2007080722A1BufferHYNIX SEMICONDUCTOR INC·Filed 2006·Application pending·0 cites
- 3431US2006227626A1Input buffer circuit of semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2005·Application pending·0 cites
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