Inventor · disambiguated record
Toshiyuki Matsumoto
Also filed as: MATSUMOTO TOSHIYUKI
55 granted patents·8 pending applications·790 citations·filing 1977–2024
98Inventor score
Top patents by PatentIndex Score
63 records- 0195US4612656ADigital indication type measuring apparatusMITUTOYO MFG CO LTD·Filed 1984·Granted Sep 16, 1986·66 cites·5 claims
- 0293US4578868ADigital display measuring apparatusMITUTOYO MFG CO LTD·Filed 1984·Granted Apr 1, 1986·59 cites·4 claims
- 0391US6828806B1Electrostatic capacitance sensor, electrostatic capacitance sensor component, object mounting body and object mounting apparatusSUMITOMO METAL IND·Filed 2000·Granted Dec 7, 2004·40 cites·12 claims
- 0490US7994793B2Jig for detecting positionTOKYO ELECTRON LTD·Filed 2008·Granted Aug 9, 2011·18 cites·11 claims
- 0587US8149005B2Jig for detecting positionMATSUMOTO TOSHIYUKI·Filed 2008·Granted Apr 3, 2012·13 cites·13 claims
- 0687US6373264B1Impedance detection apparatus and method of physical variableSUMITOMO METAL IND·Filed 1999·Granted Apr 16, 2002·82 cites·21 claims
- 0784US4748861AElectronic display measuring deviceMITUTOYO MFG CO LTD·Filed 1986·Granted Jun 7, 1988·36 cites·9 claims
- 0879US4427873AMethod and apparatus for aligning axes of assisting gas nozzles with laser beam axes in laser processing machinesAMADA ENG & SERVICE·Filed 1982·Granted Jan 24, 1984·29 cites·9 claims
- 0977US7383732B2Device for inspecting micro structure, method for inspecting micro structure and program for inspecting micro structureOCTEC INC·Filed 2005·Granted Jun 10, 2008·11 cites·30 claims
- 1077US6335642B1Impedance-to-voltage converterSUMITOMO METAL IND·Filed 1999·Granted Jan 1, 2002·35 cites·18 claims
- 1176US10655514B2Mechanical deviceKOMATSU MFG CO LTD·Filed 2016·Granted May 19, 2020·2 cites·13 claims
- 1275US6756790B2Impedance detection circuit, impedance detection device, and impedance detection methodTOKYO ELECTRON LTD·Filed 2001·Granted Jun 29, 2004·19 cites·29 claims
- 1374US8082124B2Method and system for diagnosing abnormal plasma dischargeMIYANO TAKAYA·Filed 2007·Granted Dec 20, 2011·5 cites·15 claims
- 1474US7977609B2Temperature measuring device using oscillating frequency signalsTOKYO ELECTRON LTD·Filed 2006·Granted Jul 12, 2011·4 cites·8 claims
- 1571US7726190B2Device, method and program for inspecting microstructureTOKYO ELECTRON LTD·Filed 2006·Granted Jun 1, 2010·7 cites·12 claims
- 1670US6632532B1Particle material anisotropic conductive connection and anisotropic conductive connection materialSONY CHEMICALS CORP·Filed 2000·Granted Oct 14, 2003·16 cites·9 claims
- 1770US6549237B1Image sensing apparatus capable of seeing image displayed on display device through finderCANON KK·Filed 1998·Granted Apr 15, 2003·41 cites·22 claims
- 1869US9087771B2Method for manufacturing semiconductor device, semiconductor device and jig for forming wiringTOKYO ELECTRON LTD·Filed 2014·Granted Jul 21, 2015·2 cites·11 claims
- 1969US6348809B1Microscopic capacitance measurement system and probing systemSUMITOMO METAL IND·Filed 1999·Granted Feb 19, 2002·29 cites·8 claims
- 2068US7964660B2Process for producing aqueous pigment dispersionKAO CORP·Filed 2006·Granted Jun 21, 2011·1 cites·8 claims
- 2168US7354547B2Molten-metal transferring ladle and molten-metal tapping methodNIPPON CRUCIBLE CO·Filed 2006·Granted Apr 8, 2008·2 cites·14 claims
- 2267US6331780B1Static capacitance-to-voltage converter and converting methodSUMITOMO METAL IND·Filed 1999·Granted Dec 18, 2001·24 cites·24 claims
- 2367US6034549ALevel shift circuitSUMITOMO METAL IND·Filed 1997·Granted Mar 7, 2000·21 cites·13 claims
- 2466US6326795B1Capacitance detection system and methodSUMITOMO METAL IND·Filed 1999·Granted Dec 4, 2001·20 cites·12 claims
- 2566US6012334AVibration wave detecting method and vibration wave detectorSUMITOMO METAL IND·Filed 1998·Granted Jan 11, 2000·28 cites·15 claims
- 2665US6943839B1Photographic method at time of self-photography, and image sensing apparatus thereofCANON KK·Filed 1998·Granted Sep 13, 2005·29 cites·32 claims
- 2763US7923665B2Temperature measuring device and method for measuring wafer-type thermometersTOKYO ELECTRON LTD·Filed 2006·Granted Apr 12, 2011·4 cites·9 claims
- 2862US7161360B2Electrostatic capacitance sensor, electrostatic capacitance sensor component, object mounting body and object mounting apparatusTOKYO ELECTRON LTD·Filed 2004·Granted Jan 9, 2007·7 cites·18 claims
- 2961US2025006565A1Electronic component housing package and electronic moduleKYOCERA CORP·Filed 2024·Application pending·0 cites
- 3060US7513699B2Fiber optic receptacle and optical moduleKYOCERA CORP·Filed 2006·Granted Apr 7, 2009·4 cites·15 claims
- 3158US6601877B2Piping structure of a working machineCATERPILLAR MITSUBISHI LTD·Filed 2001·Granted Aug 5, 2003·9 cites·11 claims
- 3258US6408875B1Piping structure of a working machineCATERPILLAR MITSUBISHI LTD·Filed 2001·Granted Jun 25, 2002·9 cites·6 claims
- 3357US8446338B2Image display apparatus, image signal processing method, program for implementing the method, and storage medium storing the programMATSUMOTO TOSHIYUKI·Filed 2012·Granted May 21, 2013·0 cites·13 claims
- 3455US8212743B2Image display apparatus, image signal processing method, program for implementing the method, and storage medium storing the programMATSUMOTO TOSHIYUKI·Filed 2009·Granted Jul 3, 2012·0 cites·13 claims
- 3555US5239603AIntegrally-molded ceramic alignment sleeve for optical fiber connector and method of producing the sameKYOCERA CORP·Filed 1992·Granted Aug 24, 1993·20 cites·6 claims
- 3654US11427921B2Electrolytic treatment apparatus and electrolytic treatment methodTOKYO ELECTRON LTD·Filed 2018·Granted Aug 30, 2022·0 cites·18 claims
- 3754US6227054B1Vibration wave detecting method and vibration wave detectorSUMITOMO METAL IND·Filed 1999·Granted May 8, 2001·15 cites·6 claims
- 3853US7465106B2Optical receptacleKYOCERA CORP·Filed 2004·Granted Dec 16, 2008·3 cites·8 claims
- 3952USD300009SDial gaugeMITUTOYO MGF CO LTD·Filed 1986·Granted Feb 28, 1989·6 cites·1 claims
- 4050US8749257B2Position detecting method for performing position alignment of transfer point of transfer armMATSUMOTO TOSHIYUKI·Filed 2012·Granted Jun 10, 2014·0 cites·19 claims
- 4149US8378269B2Wafer thermometer, temperature measuring device, heat treatment device and method for measuring temperature of heat treatment unitTOKYO ELECTRON LTD·Filed 2009·Granted Feb 19, 2013·2 cites·19 claims
- 4249US7755567B2Image display apparatus, image signal processing method, program for implementing the method, and storage medium storing the programCANON KK·Filed 2005·Granted Jul 13, 2010·0 cites·12 claims
- 4346US5341324ASemiconductor device and manufacturing method thereofSUMITOMO METAL IND·Filed 1992·Granted Aug 23, 1994·12 cites·7 claims
- 4445US7023223B2Impedance measuring circuit and capacitance measuring circuitTOKYO ELECTRON LTD·Filed 2002·Granted Apr 4, 2006·2 cites·6 claims
- 4544US10428438B2Substrate processing method and templateTOKYO ELECTRON LTD·Filed 2014·Granted Oct 1, 2019·0 cites·32 claims
- 4644US8212916B2Image display device, image pickup apparatus, and image display method that allow focus assistant displayMATSUMOTO TOSHIYUKI·Filed 2010·Granted Jul 3, 2012·0 cites·4 claims
- 4744US6194888B1Impedance-to-voltage converter and converting methodSUMITOMO METAL IND·Filed 1999·Granted Feb 27, 2001·11 cites·10 claims
- 4844US2008302185A1Microstructure Inspecting Apparatus and Microstructure Inspecting MethodYAKABE MASAMI·Filed 2005·Application pending·0 cites
- 4942US4487524AMethod and apparatus of forming sand piles for improving a soft groundFUDO CONSTRUCTION CO·Filed 1982·Granted Dec 11, 1984·13 cites·6 claims
- 5042US4304315ATractorKUBOTA LTD·Filed 1979·Granted Dec 8, 1981·7 cites·6 claims
Showing the top 50 of 63 patent records by PatentIndex Score.
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