Inventor · disambiguated record
Ofer Du-Nour
Also filed as: DU-NOUR OFER
7 granted patents·444 citations·filing 1999–2016
88Inventor score
Top patents by PatentIndex Score
7 records- 0196US7469164B2Method and apparatus for process control with in-die metrologyNANOMETRICS INC·Filed 2007·Granted Dec 23, 2008·98 cites·32 claims
- 0293US6678055B2Method and apparatus for measuring stress in semiconductor wafersTEVET PROCESS CONTROL TECHNOLO·Filed 2001·Granted Jan 13, 2004·139 cites·51 claims
- 0391US6885467B2Method and apparatus for thickness decomposition of complicated layer structuresTEVET PROCESS CONTROL TECHNOLO·Filed 2002·Granted Apr 26, 2005·75 cites·26 claims
- 0488US6762838B2Method and apparatus for production line screeningTEVET PROCESS CONTROL TECHNOLO·Filed 2001·Granted Jul 13, 2004·57 cites·36 claims
- 0585US6801321B1Method and apparatus for measuring lateral variations in thickness or refractive index of a transparent film on a substrateTEVET PROCESS CONTROL TECHNOLO·Filed 1999·Granted Oct 5, 2004·69 cites·34 claims
- 0678US7492467B1Method and apparatus for measuring thickness and optical properties of a thin-film on a substrateNANOMETRICS INC·Filed 2007·Granted Feb 17, 2009·6 cites·24 claims
- 0739US10656085B2High sensitivity real-time bacterial monitorBACTUSENSE TECH LTD·Filed 2016·Granted May 19, 2020·0 cites·9 claims
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