Inventor · disambiguated record

Chikara Tojima

Also filed as: TOJIMA CHIKARA

1 granted patent·21 citations·filing 1998–1998

41Inventor score

Technology areasG01B

Files withTOSHIBA CERAMICS CO1

Top patents by PatentIndex Score

1 record

0155US6025596AMethod for measuring epitaxial film thickness of multilayer epitaxial waferTOSHIBA CERAMICS CO·Filed 1998·Granted Feb 15, 2000·21 cites·3 claims

Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →