Inventor · disambiguated record
Mayeul Durand De Gevigney
Also filed as: DURAND DE GEVIGNEY MAYEUL
7 granted patents·1 pending application·6 citations·filing 2015–2024
73Inventor score
Files withUNITY SEMICONDUCTOR8
Top patents by PatentIndex Score
8 records- 0189US12074400B1Substrate dimension adapterUNITY SEMICONDUCTOR·Filed 2024·Granted Aug 27, 2024·3 cites·18 claims
- 0278US9857313B2Method and system for inspecting wafers for electronics, optics or optoelectronicsUNITY SEMICONDUCTOR·Filed 2015·Granted Jan 2, 2018·2 cites·13 claims
- 0360US10260868B2Interferometric method and system using variable fringe spacing for inspecting transparent wafers for electronics, optics or optoelectronicsUNITY SEMICONDUCTOR·Filed 2015·Granted Apr 16, 2019·1 cites·11 claims
- 0457US12163899B2System for optical inspection of a substrate using same or different wavelengthsUNITY SEMICONDUCTOR·Filed 2023·Granted Dec 10, 2024·0 cites·20 claims
- 0549US11300520B2Method and system for optically inspecting a substrateUNITY SEMICONDUCTOR·Filed 2018·Granted Apr 12, 2022·0 cites·15 claims
- 0647US11965834B2Dark-field optical inspection deviceUNITY SEMICONDUCTOR·Filed 2019·Granted Apr 23, 2024·0 cites·18 claims
- 0740US2021116694A1Lighting device for microscopeUNITY SEMICONDUCTOR·Filed 2019·Application pending·0 cites
- 0838US11092644B2Method and system for inspecting boards for microelectronics or optics by laser doppler effectUNITY SEMICONDUCTOR·Filed 2017·Granted Aug 17, 2021·0 cites·10 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →