Inventor · disambiguated record
Kirill Savchenko
Also filed as: SAVCHENKO KIRILL
4 granted patents·2 citations·filing 2017–2020
56Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD4
Top patents by PatentIndex Score
4 records- 0170US11037286B2Method of classifying defects in a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Jun 15, 2021·2 cites·20 claims
- 0248US12361531B2Machine learning-based classification of defects in a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Jul 15, 2025·0 cites·18 claims
- 0343US10921334B2System, method and computer program product for classifying defectsAPPLIED MATERIALS ISRAEL LTD·Filed 2018·Granted Feb 16, 2021·0 cites·12 claims
- 0438US11151706B2Method of classifying defects in a semiconductor specimen and system thereofAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Oct 19, 2021·0 cites·9 claims
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