Inventor · disambiguated record
Ethan Williford
Also filed as: WILLIFORD ETHAN · WILLIFORD ETHAN A
14 granted patents·206 citations·filing 2003–2015
92Inventor score
Top patents by PatentIndex Score
14 records- 0197US7968411B2Threshold voltage adjustment for long-channel transistorsMICRON TECHNOLOGY INC·Filed 2007·Granted Jun 28, 2011·118 cites·14 claims
- 0287US7422948B2Threshold voltage adjustment for long channel transistorsMICRON TECHNOLOGY INC·Filed 2005·Granted Sep 9, 2008·9 cites·20 claims
- 0384US7190608B2Sensing of resistance variable memory devicesMICRON TECHNOLOGY INC·Filed 2006·Granted Mar 13, 2007·14 cites·26 claims
- 0475US7274076B2Threshold voltage adjustment for long channel transistorsMICRON TECHNOLOGY INC·Filed 2003·Granted Sep 25, 2007·12 cites·9 claims
- 0573US7245548B2Techniques for reducing leakage current in memory devicesMICRON TECHNOLOGY INC·Filed 2004·Granted Jul 17, 2007·17 cites·28 claims
- 0672US7142446B2Apparatus and method to reduce undesirable effects caused by a fault in a memory deviceMICRON TECHNOLOGY INC·Filed 2004·Granted Nov 28, 2006·15 cites·32 claims
- 0771US9111958B2Threshold voltage adjustment of a transistorWILLIFORD ETHAN·Filed 2011·Granted Aug 18, 2015·2 cites·30 claims
- 0871US7151688B2Sensing of resistance variable memory devicesMICRON TECHNOLOGY INC·Filed 2004·Granted Dec 19, 2006·16 cites·58 claims
- 0957US10032903B2Threshold voltage adjustment of a transistorMICRON TECHNOLOGY INC·Filed 2015·Granted Jul 24, 2018·0 cites·20 claims
- 1048US7746720B2Techniques for reducing leakage current in memory devicesMICRON TECHNOLOGY INC·Filed 2007·Granted Jun 29, 2010·1 cites·27 claims
- 1146US7551509B2Power circuits for reducing a number of power supply voltage taps required for sensing a resistive memoryMICRON TECHNOLOGY INC·Filed 2008·Granted Jun 23, 2009·1 cites·20 claims
- 1246US7269079B2Power circuits for reducing a number of power supply voltage taps required for sensing a resistive memoryMICRON TECHNOLOGY INC·Filed 2005·Granted Sep 11, 2007·1 cites·10 claims
- 1341US7336522B2Apparatus and method to reduce undesirable effects caused by a fault in a memory deviceMICRON TECHNOLOGY INC·Filed 2006·Granted Feb 26, 2008·0 cites·23 claims
- 1439US7366045B2Power circuits for reducing a number of power supply voltage taps required for sensing a resistive memoryMICRON TECHNOLOGY INC·Filed 2006·Granted Apr 29, 2008·0 cites·10 claims
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