Inventor · disambiguated record
Linard Karklin
Also filed as: KARKLIN LINARD · KARKLIN LINARD N
11 granted patents·738 citations·filing 1998–2009
94Inventor score
Top patents by PatentIndex Score
11 records- 0197US6873720B2System and method of providing mask defect printability analysisSYNOPSYS INC·Filed 2001·Granted Mar 29, 2005·112 cites·54 claims
- 0297US6757645B2Visual inspection and verification systemNUMERICAL TECH INC·Filed 1998·Granted Jun 29, 2004·207 cites·64 claims
- 0395US7835565B2System and method of providing mask defect printability analysisSYNOPSYS INC·Filed 2009·Granted Nov 16, 2010·17 cites·32 claims
- 0495US7254251B2System and method of providing mask defect printability analysisSYNOPSYS INC·Filed 2005·Granted Aug 7, 2007·30 cites·8 claims
- 0594US7403649B2System and method of providing mask defect printability analysisSYNOPSYS INC·Filed 2007·Granted Jul 22, 2008·20 cites·19 claims
- 0694US6578188B1Method and apparatus for a network-based mask defect printability analysis systemNUMERICAL TECH INC·Filed 2000·Granted Jun 10, 2003·166 cites·36 claims
- 0793US7565001B2System and method of providing mask defect printability analysisSYNOPSYS INC·Filed 2008·Granted Jul 21, 2009·14 cites·32 claims
- 0893US7107571B2Visual analysis and verification system using advanced toolsSYNOPSYS INC·Filed 2001·Granted Sep 12, 2006·87 cites·60 claims
- 0992US6925202B2System and method of providing mask quality controlSYNOPSYS INC·Filed 2001·Granted Aug 2, 2005·55 cites·41 claims
- 1079US7523027B2Visual inspection and verification systemSYNOPSYS INC·Filed 2004·Granted Apr 21, 2009·14 cites·76 claims
- 1173US6681376B1Integrated scheme for semiconductor device verificationCYPRESS SEMICONDUCTOR CORP·Filed 2001·Granted Jan 20, 2004·16 cites·26 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →