Inventor · disambiguated record
William K. Waller
Also filed as: WALLER WILLIAM · WALLER WILLIAM K · WALLER WILLIAM KENNETH
57 granted patents·4 pending applications·1,696 citations·filing 1989–2022
99Inventor score
Files withMICRON TECHNOLOGY INC46INTEL CORP6WALLER WILLIAM KENNETH2INNOVATIVE SILICON ISI SA1INNOVATIVE SILICON SA1
Top patents by PatentIndex Score
61 records- 0199US7486563B2Sense amplifier circuitry and architecture to write data into and/or read from memory cellsINNOVATIVE SILICON ISI SA·Filed 2007·Granted Feb 3, 2009·274 cites·25 claims
- 0299US7301838B2Sense amplifier circuitry and architecture to write data into and/or read from memory cellsINNOVATIVE SILICON SA·Filed 2005·Granted Nov 27, 2007·162 cites·59 claims
- 0394US6636068B2Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2002·Granted Oct 21, 2003·40 cites·15 claims
- 0493US6032264AApparatus and method implementing repairs on a memory deviceMICRON TECHNOLOGY INC·Filed 1997·Granted Feb 29, 2000·96 cites·20 claims
- 0593US5910921ASelf-test of a memory deviceMICRON TECHNOLOGY INC·Filed 1997·Granted Jun 8, 1999·105 cites·31 claims
- 0692US6452415B1Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2001·Granted Sep 17, 2002·29 cites·15 claims
- 0791US7567091B2Method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2008·Granted Jul 28, 2009·11 cites·4 claims
- 0891US6313658B1Device and method for isolating a short-circuited integrated circuit (IC) from other IC's on a semiconductor waferMICRON TECHNOLOGY INC·Filed 1998·Granted Nov 6, 2001·48 cites·17 claims
- 0991US6233185B1Wafer level burn-in of memory integrated circuitsMICRON TECHNOLOGY INC·Filed 1999·Granted May 15, 2001·88 cites·28 claims
- 1090US5670905ALow-to-high voltage CMOS driver circuit for driving capacitive loadsMICRON TECHNOLOGY INC·Filed 1996·Granted Sep 23, 1997·66 cites·9 claims
- 1189US6005813ADevice and method for repairing a semiconductor memoryMICRON TECHNOLOGY INC·Filed 1997·Granted Dec 21, 1999·51 cites·11 claims
- 1285US5488583AMemory integrated circuits having on-chip topology logic driver, and methods for testing and producing such memory integrated circuitsMICRON TECHNOLOGY INC·Filed 1994·Granted Jan 30, 1996·55 cites·16 claims
- 1384US7276926B2Method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2006·Granted Oct 2, 2007·6 cites·20 claims
- 1484US5212440AQuick response CMOS voltage reference circuitMICRON TECHNOLOGY INC·Filed 1990·Granted May 18, 1993·49 cites·18 claims
- 1584US5015883ACompact multifunction logic circuitMICRON TECHNOLOGY INC·Filed 1989·Granted May 14, 1991·34 cites·3 claims
- 1683US6831475B2Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2003·Granted Dec 14, 2004·14 cites·13 claims
- 1782US6145092AApparatus and method implementing repairs on a memory deviceMICRON TECHNOLOGY INC·Filed 1999·Granted Nov 7, 2000·39 cites·36 claims
- 1881US5852581AMethod of stress testing memory integrated circuitsMICRON TECHNOLOGY INC·Filed 1996·Granted Dec 22, 1998·42 cites·23 claims
- 1979US6477662B1Apparatus and method implementing repairs on a memory deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Nov 5, 2002·22 cites·16 claims
- 2077US7276927B2Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2006·Granted Oct 2, 2007·4 cites·15 claims
- 2176US6434066B1Device and method for repairing a semiconductor memoryMICRON TECHNOLOGY INC·Filed 2001·Granted Aug 13, 2002·15 cites·22 claims
- 2276US5898629ASystem for stressing a memory integrated circuit dieMICRON TECHNOLOGY INC·Filed 1997·Granted Apr 27, 1999·31 cites·58 claims
- 2375US7034561B2Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2004·Granted Apr 25, 2006·9 cites·13 claims
- 2474US7323896B2Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2006·Granted Jan 29, 2008·3 cites·16 claims
- 2574US7212020B2Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2006·Granted May 1, 2007·3 cites·4 claims
- 2674US6125067ADevice and method for repairing a semiconductor memoryMICRON TECHNOLOGY INC·Filed 1999·Granted Sep 26, 2000·22 cites·11 claims
- 2774US5883538ALow-to-high voltage CMOS driver circuit for driving capacitive loadsMICRON TECHNOLOGY INC·Filed 1997·Granted Mar 16, 1999·24 cites·18 claims
- 2873US12277985B2Technologies for repair of memory with access linesINTEL CORP·Filed 2021·Granted Apr 15, 2025·1 cites·20 claims
- 2973US7315179B2System for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor waferMICRON TECHNOLOGY INC·Filed 2006·Granted Jan 1, 2008·3 cites·14 claims
- 3072US7028206B2Circuit and method for generating a local clock signal synchronized to an externally generated reference clock signalWALLER WILLIAM KENNETH·Filed 2002·Granted Apr 11, 2006·19 cites·13 claims
- 3171US5555429AMultiport RAM based multiprocessorMICRON TECHNOLOGY INC·Filed 1995·Granted Sep 10, 1996·53 cites·11 claims
- 3270US6574156B2Device and method for repairing a semiconductor memoryMICRON TECHNOLOGY INC·Filed 2002·Granted Jun 3, 2003·11 cites·22 claims
- 3370US6079037AMethod and apparatus for detecting intercell defects in a memory deviceMICRON TECHNOLOGY INC·Filed 1997·Granted Jun 20, 2000·25 cites·16 claims
- 3466US6310804B1Device and method for repairing a semiconductor memoryMICRON TECHNOLOGY INC·Filed 2000·Granted Oct 30, 2001·9 cites·11 claims
- 3566US6104661ASemiconductor memory with local phase generation from global phase signals and local isolation signalsMICRON TECHNOLOGY INC·Filed 1999·Granted Aug 15, 2000·18 cites·6 claims
- 3666US6028806ASemiconductor memory with local phase generation from global phase signals and local isolation signalsMICRON TECHNOLOGY INC·Filed 1998·Granted Feb 22, 2000·19 cites·20 claims
- 3765US6430094B1Method for testing a memory device having two or more memory arraysMICRON TECHNOLOGY INC·Filed 2000·Granted Aug 6, 2002·10 cites·33 claims
- 3865US5475631AMultiport RAM based multiprocessorMICRON TECHNOLOGY INC·Filed 1992·Granted Dec 12, 1995·38 cites·6 claims
- 3964US7032143B1Memory data path circuitWALLER WILLIAM KENNETH·Filed 2002·Granted Apr 18, 2006·15 cites·24 claims
- 4063US6442719B1Method and apparatus for detecting intercell defects in a memory deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Aug 27, 2002·11 cites·19 claims
- 4162US6236614B1Semiconductor memory with local phase generation from global phase signals and local isolation signalsMICRON TECHNOLOGY INC·Filed 2000·Granted May 22, 2001·9 cites·14 claims
- 4260US5274591ASerial clock noise immunity in a semiconductor memory integrated circuit having a serial portMICRON TECHNOLOGY INC·Filed 1992·Granted Dec 28, 1993·24 cites·20 claims
- 4359US5313433AWindowed flash write circuitMICRON TECHNOLOGY INC·Filed 1992·Granted May 17, 1994·18 cites·28 claims
- 4458US12394461B2Multi-deck non-volatile memory architecture with improved address line driver circuitryINTEL CORP·Filed 2022·Granted Aug 19, 2025·0 cites·20 claims
- 4558US4980582AHigh speed ECL input buffer for vertical fuse arraysNAT SEMICONDUCTOR CORP·Filed 1989·Granted Dec 25, 1990·11 cites·11 claims
- 4656US12254946B2Multi-deck non-volatile memory architecture with reduced termination tile areaINTEL CORP·Filed 2021·Granted Mar 18, 2025·0 cites·20 claims
- 4756US12237040B2Method and apparatus to perform a read of a column in a memory accessible by row and/or by columnINTEL CORP·Filed 2021·Granted Feb 25, 2025·0 cites·20 claims
- 4855US5999033ALow-to-high voltage CMOS driver circuit for driving capacitive loadsMICRON TECHNOLOGY INC·Filed 1999·Granted Dec 7, 1999·11 cites·18 claims
- 4952US2009273360A1SYSTEM FOR ISOLATING A SHORT-CIRCUITED INTEGRATED CIRCUIT (IC) FROM OTHER ICs ON A SEMICONDUCTOR WAFERMICRON TECHNOLOGY INC·Filed 2009·Application pending·0 cites
- 5051US6134160AMemory device architecture having global memory array repair capabilitiesTEXAS INSTRUMENTS INC·Filed 1999·Granted Oct 17, 2000·14 cites·20 claims
Showing the top 50 of 61 patent records by PatentIndex Score.
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