Inventor · disambiguated record
Joseph Eckelman
Also filed as: ECKELMAN JOSEPH · ECKELMAN JOSEPH E
7 granted patents·1 pending application·85 citations·filing 2000–2008
86Inventor score
Files withIBM8
Top patents by PatentIndex Score
8 records- 0190US7908532B2Automated system and processing for expedient diagnosis of broken shift registers latch chainsIBM·Filed 2008·Granted Mar 15, 2011·22 cites·20 claims
- 0278US7930601B2AC ABIST diagnostic method, apparatus and program productIBM·Filed 2008·Granted Apr 19, 2011·11 cites·16 claims
- 0367US7765445B2Analog testing of ring oscillators using built-in self test apparatusIBM·Filed 2008·Granted Jul 27, 2010·7 cites·20 claims
- 0467US6774656B2Self-test for leakage current of driver/receiver stagesIBM·Filed 2001·Granted Aug 10, 2004·13 cites·20 claims
- 0566US6725171B2Self-test with split, asymmetric controlled driver output stageIBM·Filed 2001·Granted Apr 20, 2004·12 cites·9 claims
- 0662US7076706B2Method and apparatus for ABIST diagnosticsIBM·Filed 2001·Granted Jul 11, 2006·10 cites·7 claims
- 0758US6751765B1Method and system for determining repeatable yield detractors of integrated circuitsIBM·Filed 2000·Granted Jun 15, 2004·10 cites·10 claims
- 0836US2006195288A1Method for at speed testing of multi-clock domain chipsIBM·Filed 2005·Application pending·0 cites
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