Inventor · disambiguated record
Hideyuki Fukuhara
Also filed as: FUKUHARA HIDEYUKI
9 granted patents·2 pending applications·235 citations·filing 1995–2003
90Inventor score
Top patents by PatentIndex Score
11 records- 0180US5618750AMethod of making fuse with non-corrosive termination of corrosive fuse materialTEXAS INSTRUMENTS INC·Filed 1995·Granted Apr 8, 1997·65 cites·5 claims
- 0278US6249472B1Semiconductor memory device with antifuseTEXAS INSTRUMENTS INC·Filed 1998·Granted Jun 19, 2001·63 cites·20 claims
- 0370US6038191ACircuit for reducing stand-by current induced by defects in memory arrayTEXAS INSTRUMENTS INC·Filed 1998·Granted Mar 14, 2000·38 cites·76 claims
- 0456US5754432AApparatus and method for estimating chip yieldTEXAS INSTRUMENTS INC·Filed 1995·Granted May 19, 1998·26 cites·9 claims
- 0546US5641701AMethod for fabricating a semiconductor device with laser programable fusesTEXAS INSTRUMENTS INC·Filed 1995·Granted Jun 24, 1997·13 cites·7 claims
- 0643US6331739B1Fuse in top level metal and in a step, process of making and process of trimmingTEXAS INSTRUMENTS INC·Filed 1997·Granted Dec 18, 2001·10 cites·15 claims
- 0742US2004049529A1Partial product generator and multiplierFiled 2003·Application pending·0 cites
- 0841US6434063B1Method of repairing semiconductor memory, electron-beam memory repairing apparatus and redundancy memory circuit to which the method of repairing semiconductor memory is applicableADVANTEST CORP·Filed 1998·Granted Aug 13, 2002·8 cites·4 claims
- 0937US5650355AProcess of making and process of trimming a fuse in a top level metal and in a stepTEXAS INSTRUMENTS INC·Filed 1995·Granted Jul 22, 1997·7 cites·11 claims
- 1036US2002173055A1Redundancy memory circuitFiled 2002·Application pending·0 cites
- 1135US5985677AMethod of repairing semiconductor memory, electron-beam memory repairing apparatus and redundancy memory circuit to which the method of repairing semiconductor memory is applicableADVANTEST CORP·Filed 1997·Granted Nov 16, 1999·5 cites·10 claims
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