Inventor · disambiguated record
Hwan-Shik Park
Also filed as: PARK HWAN-SHIK
5 granted patents·1 pending application·7 citations·filing 2004–2010
69Inventor score
Top patents by PatentIndex Score
6 records- 0159US7375003B2Methods of manufacturing a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted May 20, 2008·2 cites·19 claims
- 0258US7197426B2Method and apparatus for measuring thickness of metal layerSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Mar 27, 2007·3 cites·20 claims
- 0349US8551791B2Apparatus and method for manufacturing semiconductor devices through layer material dimension analysisPARK JANG-IK·Filed 2009·Granted Oct 8, 2013·1 cites·20 claims
- 0441US2007184565A1Test pattern and method for measuring silicon etching depthSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 0539US7355729B2Apparatus and method for measuring a thickness of a substrateSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Apr 8, 2008·1 cites·19 claims
- 0634US8446583B2Light focusing unit and spectrum measuring apparatus having the sameKIM HYUN-JONG·Filed 2010·Granted May 21, 2013·0 cites·17 claims
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