Inventor · disambiguated record
Michael Hyatt
Also filed as: HYATT MICHAEL · HYATT MICHAEL D
24 granted patents·3 pending applications·36 citations·filing 2001–2017
93Inventor score
Top patents by PatentIndex Score
27 records- 0185US8486611B2Semiconductor constructions and methods of forming patternsMILLWARD DAN·Filed 2010·Granted Jul 16, 2013·7 cites·16 claims
- 0283US8815497B2Semiconductor constructions and methods of forming patternsMICRON TECHNOLOGY INC·Filed 2013·Granted Aug 26, 2014·5 cites·24 claims
- 0381US8440371B2Imaging devices, methods of forming same, and methods of forming semiconductor device structuresHE YUAN·Filed 2011·Granted May 14, 2013·3 cites·24 claims
- 0478US9780029B2Semiconductor constructions having conductive lines which merge with one anotherMICRON TECHNOLOGY INC·Filed 2015·Granted Oct 3, 2017·2 cites·8 claims
- 0575US9583381B2Methods for forming semiconductor devices and semiconductor device structuresMICRON TECHNOLOGY INC·Filed 2013·Granted Feb 28, 2017·3 cites·20 claims
- 0675US9213239B2Methods of forming patterns for semiconductor device structuresLIGHT SCOTT·Filed 2013·Granted Dec 15, 2015·4 cites·25 claims
- 0773US8883372B2Reticle with composite polarizer and method of simultaneous optimization of imaging of a set of different patternsLIGHT SCOTT·Filed 2012·Granted Nov 11, 2014·2 cites·18 claims
- 0871US9330914B2Methods of forming line patterns in substratesMICRON TECHNOLOGY INC·Filed 2013·Granted May 3, 2016·2 cites·38 claims
- 0969US8969214B2Methods of forming a pattern on a substrateMICRON TECHNOLOGY INC·Filed 2013·Granted Mar 3, 2015·2 cites·21 claims
- 1069US8507191B2Methods of forming a patterned, silicon-enriched developable antireflective material and semiconductor device structures including the sameMILLWARD DAN B·Filed 2011·Granted Aug 13, 2013·2 cites·31 claims
- 1167US8153522B2Patterning mask and method of formation of mask using step double patterningDEVILLIERS ANTON·Filed 2010·Granted Apr 10, 2012·2 cites·24 claims
- 1266US8625078B2Illumination design for lens heating mitigationZHOU JIANMING·Filed 2011·Granted Jan 7, 2014·1 cites·6 claims
- 1365US9048292B2Patterning methods and methods of forming electrically conductive linesMICRON TECHNOLOGY INC·Filed 2012·Granted Jun 2, 2015·1 cites·10 claims
- 1458US10217706B2Semiconductor constructionsMICRON TECHNOLOGY INC·Filed 2017·Granted Feb 26, 2019·0 cites·15 claims
- 1557US2015015860A1Reticles, And Methods Of Mitigating Asymmetric Lens Heating In PhotolithographyMICRON TECHNOLOGY INC·Filed 2014·Application pending·0 cites
- 1653US9140977B2Imaging devices, methods of forming same, and methods of forming semiconductor device structuresMICRON TECHNOLOGY INC·Filed 2013·Granted Sep 22, 2015·0 cites·20 claims
- 1753US8685630B2Methods of forming a pattern in a material and methods of forming openings in a material to be patternedMICRON TECHNOLOGY INC·Filed 2013·Granted Apr 1, 2014·0 cites·20 claims
- 1851US8871407B2Patterning mask and method of formation of mask using step double patterningDEVILLIERS ANTON·Filed 2012·Granted Oct 28, 2014·0 cites·5 claims
- 1951US8845908B2Reticles, and methods of mitigating asymmetric lens heating in photolithographyLIGHT SCOTT L·Filed 2010·Granted Sep 30, 2014·0 cites·24 claims
- 2049US9465287B2Methods of forming patterns for semiconductor device structuresMICRON TECHNOLOGY INC·Filed 2015·Granted Oct 11, 2016·0 cites·17 claims
- 2147US9358753B2Substrates and methods of forming a pattern on a substrateMICRON TECHNOLOGY INC·Filed 2015·Granted Jun 7, 2016·0 cites·13 claims
- 2247US9102121B2Substrates and methods of forming a pattern on a substrateSIPANI VISHAL·Filed 2012·Granted Aug 11, 2015·0 cites·17 claims
- 2345US8512938B2Methods of forming a pattern in a material and methods of forming openings in a material to be patternedDEVILLIERS ANTON·Filed 2010·Granted Aug 20, 2013·0 cites·20 claims
- 2443US9235134B2Lens heating compensation in photolithographyHE YUAN·Filed 2010·Granted Jan 12, 2016·0 cites·21 claims
- 2542US8728721B2Methods of processing substratesLIGHT SCOTT L·Filed 2011·Granted May 20, 2014·0 cites·12 claims
- 2635US2014054756A1Anti spacer process and semiconductor structure generated by the anti spacer processHYATT MICHAEL·Filed 2012·Application pending·0 cites
- 2734US2002004830A1Method and system for providing engineering analysis tools in a distributed environmentFiled 2001·Application pending·0 cites
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