Inventor · disambiguated record
Byeng Gi Lee
Also filed as: LEE BYENG GI
3 granted patents·135 citations·filing 2002–2003
75Inventor score
Top patents by PatentIndex Score
3 records- 0190US6861861B2Device for compensating for a test temperature deviation in a semiconductor device handlerMIRAE CORPORATION·Filed 2003·Granted Mar 1, 2005·103 cites·28 claims
- 0272US6723964B2Apparatus for heating and cooling semiconductor device in handler for testing semiconductor deviceMIRAE CORP·Filed 2002·Granted Apr 20, 2004·18 cites·25 claims
- 0369US7008804B2Methods for compensating for a test temperature deviationMIRAE CORP·Filed 2003·Granted Mar 7, 2006·14 cites·20 claims
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