Inventor · disambiguated record
Leon Ashley
Also filed as: ASHLEY LEON
3 granted patents·259 citations·filing 1997–1999
79Inventor score
Technology areasH10W
Files withIBM3
Top patents by PatentIndex Score
3 records- 0191US6130161AMethod of forming copper interconnections with enhanced electromigration resistance and reduced defect sensitivityIBM·Filed 1997·Granted Oct 10, 2000·111 cites·13 claims
- 0287US6348731B1Copper interconnections with enhanced electromigration resistance and reduced defect sensitivity and method of forming sameIBM·Filed 1999·Granted Feb 19, 2002·77 cites·5 claims
- 0387US6287954B1Method of forming copper interconnections with enhanced electromigration resistance and reduced defect sensitivityIBM·Filed 1999·Granted Sep 11, 2001·71 cites·15 claims
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