Inventor · disambiguated record
Hisashi Shiozawa
Also filed as: SHIOZAWA HISASHI
3 granted patents·22 citations·filing 1996–2004
63Inventor score
Files withNIKON CORP3
Top patents by PatentIndex Score
3 records- 0149US6963408B2Method and apparatus for point diffraction interferometryNIKON CORP·Filed 2004·Granted Nov 8, 2005·5 cites·32 claims
- 0238US5692728ASupporting device having elastic members with oscillation mechanismsNIKON CORP·Filed 1996·Granted Dec 2, 1997·17 cites·4 claims
- 0332US6940605B2Method for measuring interference and apparatus for measuring interferenceNIKON CORP·Filed 2001·Granted Sep 6, 2005·0 cites·9 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →