Inventor · disambiguated record
Wei-Cheng Ku
Also filed as: KU WEI CHENG JOSEPH · KU WEI-CHENG
42 granted patents·13 pending applications·144 citations·filing 2001–2023
96Inventor score
Top patents by PatentIndex Score
55 records- 0196US9678896B2System and method for hardware based securityCERTICOM CORP·Filed 2015·Granted Jun 13, 2017·23 cites·17 claims
- 0287US9596769B2Multilayer circuit boardMPI CORP·Filed 2015·Granted Mar 14, 2017·5 cites·11 claims
- 0387US7595651B2Cantilever-type probe card for high frequency applicationMPI CORP·Filed 2007·Granted Sep 29, 2009·24 cites·11 claims
- 0486US10070512B2Multilayer circuit boardMPI CORP·Filed 2017·Granted Sep 4, 2018·4 cites·8 claims
- 0586US7791359B2Probe for high frequency signal transmission and probe card using the sameMPI CORP·Filed 2008·Granted Sep 7, 2010·11 cites·16 claims
- 0684US7368928B2Vertical type high frequency probe cardMJC PROBE INC·Filed 2006·Granted May 6, 2008·16 cites·9 claims
- 0780US9316685B2Probe card of low power lossMPI CORP·Filed 2013·Granted Apr 19, 2016·4 cites·16 claims
- 0879US10295567B2Probe module supporting loopback testMPI CORP·Filed 2016·Granted May 21, 2019·2 cites·6 claims
- 0979US7683645B2High-frequency probe card and transmission line for high-frequency probe cardMPI CORP·Filed 2006·Granted Mar 23, 2010·11 cites·21 claims
- 1074US6649077B2Method and apparatus for removing coating layers from alignment marks on a waferTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Nov 18, 2003·21 cites·17 claims
- 1173US10033989B2Synchronization controller for multi-sensor camera device and related synchronization methodMEDIATEK INC·Filed 2014·Granted Jul 24, 2018·2 cites·16 claims
- 1270US9442134B2Signal path switch and probe card having the signal path switchMPI CORP·Filed 2014·Granted Sep 13, 2016·2 cites·9 claims
- 1369US7782070B2Probing deviceMJC PROBE INC·Filed 2008·Granted Aug 24, 2010·5 cites·31 claims
- 1468US9658249B2Probe card capable of transmitting high-frequency signalsMPI CORP·Filed 2013·Granted May 23, 2017·2 cites·1 claims
- 1565US9759746B2Probe moduleMPI CORP·Filed 2014·Granted Sep 12, 2017·2 cites·6 claims
- 1664US8884640B2Integrated high-speed probe systemWANG CHUN-CHI·Filed 2012·Granted Nov 11, 2014·2 cites·21 claims
- 1761US8638116B2Probe card having configurable structure for exchanging or swapping electronic components for impedance matching and impedance matching method thereforeHUANG CHAO-CHING·Filed 2011·Granted Jan 28, 2014·1 cites·3 claims
- 1859US9500675B2Probe module supporting loopback testMPI CORP·Filed 2014·Granted Nov 22, 2016·1 cites·15 claims
- 1959US9459279B2Electrical testing machineMPI CORP·Filed 2014·Granted Oct 4, 2016·1 cites·9 claims
- 2057US7724009B2Method of making high-frequency probe, probe card using the high-frequency probeMPI CORP·Filed 2009·Granted May 25, 2010·3 cites·15 claims
- 2156US2024118313A1Probe head having spring probesMPI CORP·Filed 2023·Application pending·0 cites
- 2254US9927487B2Probe card having configurable structure for exchanging or swapping electronic components for impedance matchingMPI CORP·Filed 2013·Granted Mar 27, 2018·0 cites·16 claims
- 2353US8542027B2Probe cardCHOU YOUNG-HUANG·Filed 2010·Granted Sep 24, 2013·2 cites·14 claims
- 2452US2016018439A1Probe card, and connecting circuit board and signal feeding structure thereofMPI CORP·Filed 2015·Application pending·0 cites
- 2552US2016018441A1Probe card, and connecting circuit board and signal feeding structure thereofMPI CORP·Filed 2015·Application pending·0 cites
- 2651US9519010B2Integrated high-speed probe systemMPI CORP·Filed 2014·Granted Dec 13, 2016·0 cites·26 claims
- 2750US9645197B2Method of operating testing systemMPI CORP·Filed 2014·Granted May 9, 2017·0 cites·11 claims
- 2848US10054627B2Testing jigMPI CORP·Filed 2014·Granted Aug 21, 2018·0 cites·5 claims
- 2947US10101362B2Probe module with high stabilityMPI CORP·Filed 2014·Granted Oct 16, 2018·0 cites·4 claims
- 3047US9622348B2Multilayer circuit boardMPI CORP·Filed 2014·Granted Apr 11, 2017·0 cites·10 claims
- 3146US9759743B2Testing system and method for testing of electrical connectionsMPI CORP·Filed 2014·Granted Sep 12, 2017·0 cites·19 claims
- 3245US9410986B2Testing jigMPI CORP·Filed 2014·Granted Aug 9, 2016·0 cites·8 claims
- 3345US8648739B2Transmission interface and system using the sameKU WEI-CHENG·Filed 2010·Granted Feb 11, 2014·0 cites·21 claims
- 3445US2015168454A1Probe moduleMPI CORP·Filed 2014·Application pending·0 cites
- 3544US9545002B2Multilayer circuit boardMPI CORP·Filed 2015·Granted Jan 10, 2017·0 cites·12 claims
- 3644US9523708B2Electrical testing deviceMPI CORP·Filed 2014·Granted Dec 20, 2016·0 cites·8 claims
- 3744US8106673B2Probe for high frequency signal transmissionKU WEI-CHENG·Filed 2010·Granted Jan 31, 2012·0 cites·14 claims
- 3843US9581676B2Method of calibrating and debugging testing systemMPI CORP·Filed 2014·Granted Feb 28, 2017·0 cites·9 claims
- 3941US9470716B2Probe moduleMPI CORP·Filed 2014·Granted Oct 18, 2016·0 cites·10 claims
- 4040US11536765B2Probing apparatusMPI CORP·Filed 2020·Granted Dec 27, 2022·0 cites·10 claims
- 4140US10067163B2Probe card capable of transmitting high-frequency signalsMPI CORP·Filed 2016·Granted Sep 4, 2018·0 cites·19 claims
- 4240US2015204929A1Testing system and method of instant informing with the sameMPI CORP·Filed 2014·Application pending·0 cites
- 4340US2015212186A1Method of calibrating and operating testing systemMPI CORP·Filed 2014·Application pending·0 cites
- 4439US9835651B2Cantilever type probe card for high frequency signal transmissionMPI CORP·Filed 2015·Granted Dec 5, 2017·0 cites·14 claims
- 4539US2007200584A1High frequency cantilever-type probe cardMJC PROBE INC·Filed 2007·Application pending·0 cites
- 4638US2015015291A1Cantilever probe card for high-frequency signal transmissionMPI CORP·Filed 2014·Application pending·0 cites
- 4737US8421655B2Apparatus for parallel entropy encoding and decodingIMTHURN PAUL DANIEL·Filed 2011·Granted Apr 16, 2013·0 cites·21 claims
- 4837US2012242360A1High-frequency coupling testing device by coupling effectHUANG KENG-YI·Filed 2012·Application pending·0 cites
- 4937US2017115326A1Probe moduleMPI CORP·Filed 2016·Application pending·0 cites
- 5036US2015168531A1Calibration plateMPI CORP·Filed 2014·Application pending·0 cites
Showing the top 50 of 55 patent records by PatentIndex Score.
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