Inventor · disambiguated record
Paulus Antonius Andreas Teunissen
Also filed as: TEUNISSEN PAULUS ANTONIUS ANDR · TEUNISSEN PAULUS ANTONIUS ANDREAS
14 granted patents·2 pending applications·612 citations·filing 2003–2025
92Inventor score
Top patents by PatentIndex Score
16 records- 0195US11360396B2Mode control of photonic crystal fiber based broadband radiation sourcesASML NETHERLANDS BV·Filed 2020·Granted Jun 14, 2022·45 cites·20 claims
- 0295US7646471B2Lithographic apparatus, level sensor, method of inspection, device manufacturing method, and device manufactured therebyASML NETHERLANDS BV·Filed 2007·Granted Jan 12, 2010·246 cites·22 claims
- 0395US7265364B2Level sensor for lithographic apparatusASML NETHERLANDS BV·Filed 2004·Granted Sep 4, 2007·278 cites·34 claims
- 0494US11333825B2Method of manufacture of a capillary for a hollow-core photonic crystal fiberASML NETHERLANDS BV·Filed 2020·Granted May 17, 2022·4 cites·20 claims
- 0585US2025355367A1Mode control of photonic crystal fiber based broadband radiation sourcesASML NETHERLANDS BV·Filed 2025·Application pending·0 cites
- 0682US12386270B2Mode control of photonic crystal fiber based broadband radiation sourcesASML NETHERLANDS BV·Filed 2023·Granted Aug 12, 2025·0 cites·20 claims
- 0779US11687009B2Mode control of photonic crystal fiber based broadband radiation sourcesASML NETHERLANDS BV·Filed 2022·Granted Jun 27, 2023·0 cites·20 claims
- 0879US8582082B2Method and lithographic apparatus for measuring and acquiring height data relating to a substrate surfaceSTAALS FRANK·Filed 2009·Granted Nov 12, 2013·8 cites·19 claims
- 0976US7248337B2Lithographic apparatus, level sensor, method of inspection, device manufacturing method, and device manufactured therebyASML NETHERLANDS BV·Filed 2004·Granted Jul 24, 2007·13 cites·24 claims
- 1074US12130468B2Method of manufacture of a capillary for a hollow-core photonic crystal fiberASML NETHERLANDS BV·Filed 2022·Granted Oct 29, 2024·0 cites·20 claims
- 1168US10520824B2Wavelength combining of multiple sourceASML NETHERLANDS BV·Filed 2017·Granted Dec 31, 2019·1 cites·20 claims
- 1267US6906785B2Lithographic apparatus, device manufacturing method, and device manufactured therebyASML NETHERLANDS BV·Filed 2003·Granted Jun 14, 2005·11 cites·11 claims
- 1365US11327412B2Topography measurement systemASML NETHERLANDS BV·Filed 2016·Granted May 10, 2022·1 cites·21 claims
- 1457US6987555B2Lithographic apparatus, device manufacturing method, and device manufactured therebyASML NETHERLANDS BV·Filed 2004·Granted Jan 17, 2006·5 cites·29 claims
- 1549US10394143B2Topography measurement systemASML NETHERLANDS BV·Filed 2016·Granted Aug 27, 2019·0 cites·20 claims
- 1647US2009262320A1Method and Lithographic Apparatus for Acquiring Height Data Relating to a Substrate SurfaceASML NETHERLANDS BV·Filed 2009·Application pending·0 cites
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