Inventor · disambiguated record
Ushio Hase
Also filed as: HASE USHIO
7 granted patents·133 citations·filing 1995–1998
87Inventor score
Files withNEC CORP7
Top patents by PatentIndex Score
7 records- 0164US5714676AMethod and apparatus for analyzing gas components and apparatus for collecting sample gasesNEC CORP·Filed 1995·Granted Feb 3, 1998·30 cites·25 claims
- 0261US6171975B1Wet-chemical treatment method, treatment method of semiconductor substrate, and manufacturing method of semiconductor deviceNEC CORP·Filed 1998·Granted Jan 9, 2001·29 cites·7 claims
- 0359US6033459AGas collection apparatus, gas analyzing apparatus using the same and gas analyzing methodNEC CORP·Filed 1998·Granted Mar 7, 2000·23 cites·16 claims
- 0457US6286526B1Method for treatment of semiconductor substrate with chemical solution and apparatus used for said treatmentNEC CORP·Filed 1998·Granted Sep 11, 2001·22 cites·4 claims
- 0552US5841022AGas analyzer and gas analysis methodNEC CORP·Filed 1997·Granted Nov 24, 1998·18 cites·7 claims
- 0635US6030844AMethod and apparatus for pre-analyzing treatment for subsequent analysis of metal components in volatile alkali solution and non-volatile anion in volatine acid solution and method and apparatus for the subsequent analysisNEC CORP·Filed 1997·Granted Feb 29, 2000·5 cites·7 claims
- 0735US5516701AMethod for trace analysis of impurity, and light absorption measuring apparatus, measuring cell and aliquotting device used in the methodNEC CORP·Filed 1995·Granted May 14, 1996·6 cites·4 claims
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