Inventor · disambiguated record
Norio Funahashi
Also filed as: FUNAHASHI NORIO
3 granted patents·60 citations·filing 1990–1998
73Inventor score
Files withNEC CORP3
Top patents by PatentIndex Score
3 records- 0170US5086413ANon-volatile semiconductor memory device having an improved testing mode of operation and method of forming checkerwise test pattern in memory cell arrayNEC CORP·Filed 1990·Granted Feb 4, 1992·34 cites·19 claims
- 0246US6043749AFrequency detection circuitNEC CORP·Filed 1998·Granted Mar 28, 2000·14 cites·4 claims
- 0343US6028335ASemiconductor deviceNEC CORP·Filed 1998·Granted Feb 22, 2000·12 cites·20 claims
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