Inventor · disambiguated record
Bert M. Vermeire
Also filed as: VERMEIRE BERT · VERMEIRE BERT M
12 granted patents·270 citations·filing 2003–2011
92Inventor score
Top patents by PatentIndex Score
12 records- 0195US7501832B2Method and circuit for the detection of solder-joint failures in a digital electronic packageRIDGETOP GROUP INC·Filed 2006·Granted Mar 10, 2009·38 cites·17 claims
- 0294US7332902B1Micro sensor for electrochemically monitoring residue in micro channelsENVIRONMENTAL METROLOGY CORP·Filed 2005·Granted Feb 19, 2008·40 cites·23 claims
- 0393US7271608B1Prognostic cell for predicting failure of integrated circuitsRIDGETOP GROUP INC·Filed 2003·Granted Sep 18, 2007·86 cites·55 claims
- 0492US7239163B1Die-level process monitor and methodRIDGETOP GROUP INC·Filed 2005·Granted Jul 3, 2007·43 cites·29 claims
- 0587US9024606B2Low-to-medium power single chip digital controlled DC-DC regulator for point-of-load applicationsADELL PHILIPPE C·Filed 2011·Granted May 5, 2015·14 cites·18 claims
- 0687US7196294B2Method and resistive bridge circuit for the detection of solder-joint failures in a digital electronic packageRIDGETOP GROUP INC·Filed 2006·Granted Mar 27, 2007·18 cites·30 claims
- 0783US8253422B2Method of manufacture of wafers using an electro-chemical residue sensor (ECRS)VERMEIRE BERT M·Filed 2011·Granted Aug 28, 2012·6 cites·8 claims
- 0881US7489141B1Surface micro sensor and methodENVIRONMENTAL METROLOGY CORP·Filed 2005·Granted Feb 10, 2009·11 cites·18 claims
- 0976US7932726B1Method of design optimization and monitoring the clean/rinse/dry processes of patterned wafers using an electro-chemical residue sensor (ECRS)ENVIRONMENTAL METROLOGY CORP·Filed 2008·Granted Apr 26, 2011·4 cites·18 claims
- 1071US8030943B2Circuit for the detection of solder-joint failures in a digital electronic packageRIDGETOP GROUP INC·Filed 2009·Granted Oct 4, 2011·5 cites·11 claims
- 1166US7317317B1Shielded micro sensor and method for electrochemically monitoring residue in micro featuresENVIRONMENTAL METROLOGY CORP·Filed 2005·Granted Jan 8, 2008·5 cites·19 claims
- 1249US8120368B2Method of monitoring the clean/rinse/dry processes of patterned wafers using an electro-chemical residue sensor (ECRS)VERMEIRE BERT M·Filed 2011·Granted Feb 21, 2012·0 cites·5 claims
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