Inventor · disambiguated record
Shinichi Dosaka
Also filed as: DOSAKA SHINICHI
11 granted patents·4 pending applications·170 citations·filing 1982–2009
91Inventor score
Top patents by PatentIndex Score
15 records- 0186US7630065B2Low-light specimen image pickup unit and low-light specimen image pickup apparatusOLYMPUS CORP·Filed 2006·Granted Dec 8, 2009·10 cites·30 claims
- 0282US5128808ATurret condenser for microscopesOLYMPUS OPTICAL CO·Filed 1990·Granted Jul 7, 1992·63 cites·6 claims
- 0381US7684031B2Visual inspection apparatus, visual inspection method, and peripheral edge inspection unit that can be mounted on visual inspection apparatusOLYMPUS CORP·Filed 2007·Granted Mar 23, 2010·8 cites·8 claims
- 0479US7570362B2Optical measurement apparatus utilizing total reflectionOLYMPUS CORP·Filed 2008·Granted Aug 4, 2009·6 cites·13 claims
- 0561US5228357AStage driving device for optical examining apparatusOLYMPUS OPTICAL CO·Filed 1991·Granted Jul 20, 1993·21 cites·5 claims
- 0660US7264966B2Method of isolating cell or sample to be analyzed in cellOLYMPUS OPTICAL CO·Filed 2003·Granted Sep 4, 2007·1 cites·14 claims
- 0757US6956229B2Fluorescence reader wherein uniform fluorescence measurement is accomplished regardless of the state of the measurement objectOLYMPUS CORP·Filed 2003·Granted Oct 18, 2005·3 cites·5 claims
- 0856US5317142AAutomatic focusing apparatus which removes light reflected by a lower surface of a sampleOLYMPUS OPTICAL CO·Filed 1992·Granted May 31, 1994·20 cites·12 claims
- 0956US2009316143A1Visual inspection apparatus, visual inspection method, and peripheral edge inspection unit that can be mounted on visual inspection apparatus.OLYMPUS CORP·Filed 2009·Application pending·0 cites
- 1054US5175644AMicroscope apparatusOLYMPUS OPTICAL CO·Filed 1991·Granted Dec 29, 1992·19 cites·18 claims
- 1148US2008176307A1Method of isolating cell or sample to be analyzed in cellOLYMPUS OPTICAL CO·Filed 2007·Application pending·0 cites
- 1247US2009195788A1Apparatus for profile irregularity measurement and surface imperfection observation; method of profile irregularity measurement and surface imperfection observation; and inspection method of profile irregularity and surface imperfectionDOSAKA SHINICHI·Filed 2008·Application pending·0 cites
- 1344US4533220AIndicating device for indicating data within the visual field of microscopeOLYMPUS OPTICAL CO·Filed 1982·Granted Aug 6, 1985·8 cites·1 claims
- 1443US5303082AStereomicroscope including two pair of polarizers and a quarter wavelength plateOLYMPUS OPTICAL CO·Filed 1992·Granted Apr 12, 1994·11 cites·14 claims
- 1541US2004256571A1Cell cultivating and detecting deviceOLYMPUS CORP·Filed 2004·Application pending·0 cites
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