Inventor · disambiguated record
Shuji Kikuchi
Also filed as: KIKUCHI SHUJI
18 granted patents·4 pending applications·305 citations·filing 1986–2017
95Inventor score
Top patents by PatentIndex Score
22 records- 0188US5343047AIon implantation systemTOKYO ELECTRON LTD·Filed 1993·Granted Aug 30, 1994·62 cites·19 claims
- 0284US9413040B2Secondary battery unitMURAKAMI MANABU·Filed 2012·Granted Aug 9, 2016·12 cites·10 claims
- 0383US7546506B2DRAM stacked package, DIMM, and semiconductor manufacturing methodHITACHI LTD·Filed 2006·Granted Jun 9, 2009·15 cites·7 claims
- 0483US7137055B2Semiconductor testing equipment, testing method for semiconductor, fabrication method of semiconductor, and semiconductor memoryELPIDA MEMORY INC·Filed 2004·Granted Nov 14, 2006·38 cites·15 claims
- 0578US8168950B2Charged particle beam apparatus, and image generation method with charged particle beam apparatusFURUHASHI KANJI·Filed 2008·Granted May 1, 2012·10 cites·10 claims
- 0674US5089710AIon implantation equipmentTOKYO ELECTRON LTD·Filed 1990·Granted Feb 18, 1992·32 cites·11 claims
- 0769US7114110B2Semiconductor device, and the method of testing or making of the semiconductor deviceRENESAS TECH CORP·Filed 2003·Granted Sep 26, 2006·12 cites·5 claims
- 0867US4785188APrimary particle beam irradiation apparatus and method of irradiation thereofFUJITSU LTD·Filed 1987·Granted Nov 15, 1988·16 cites·17 claims
- 0967US4783597AIon implant apparatusTOSHIBA KK·Filed 1986·Granted Nov 8, 1988·16 cites·12 claims
- 1066US6826720B2Testing board for semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memoryRENESAS TECH CORP·Filed 2001·Granted Nov 30, 2004·13 cites·13 claims
- 1163US5018145AIC testerHITACHI LTD·Filed 1989·Granted May 21, 1991·25 cites·6 claims
- 1260US8653458B2Charged particle beam deviceGUNJI YOSHIRO·Filed 2011·Granted Feb 18, 2014·1 cites·9 claims
- 1359US4759021ATest pattern generatorHITACHI LTD·Filed 1986·Granted Jul 19, 1988·18 cites·6 claims
- 1457US8385627B2Method and apparatus for inspecting defects of semiconductor deviceHITACHI HIGH TECH CORP·Filed 2006·Granted Feb 26, 2013·2 cites·7 claims
- 1555US4905183APattern generator having plural pattern generating units executing instructions in parallelHITACHI LTD·Filed 1987·Granted Feb 27, 1990·27 cites·5 claims
- 1647US8032332B2Semiconductor inspecting apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted Oct 4, 2011·0 cites·12 claims
- 1746US7225372B2Testing board for semiconductor memory, method of testing semiconductor memory and method of manufacturing semiconductor memoryRENESAS TECHNOLOGY CORP & HITA·Filed 2004·Granted May 29, 2007·6 cites·6 claims
- 1844US2015010796A1Interlocking device for batery unit boardTOSHIBA KK·Filed 2014·Application pending·0 cites
- 1937US2006249829A1Stacked type semiconductor deviceKATAGIRI MITSUAKI·Filed 2006·Application pending·0 cites
- 2033US10437589B2Distributed processing control system and distributed processing control methodHONDA MOTOR CO LTD·Filed 2017·Granted Oct 8, 2019·0 cites·11 claims
- 2129US2006164115A1Defect analyzing device for semiconductor integrated circuits, system therefor, and detection methodKOMIYA YASUMARO·Filed 2003·Application pending·0 cites
- 2223US2006017455A1Defect diagnosis method and apparatus for semiconductor integrated circuitKIKUCHI SHUJI·Filed 2005·Application pending·0 cites
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